AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L18, AN78L18M (18V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
20.5 to 33V, I
O
=
1 to 70mA
V
I
=
20.5 to 33V, T
j
=
25°C
V
I
=
21 to 33V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
21 to 33V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
21 to 31V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
36
150
46
1.7
140
−1.5
Conditions
Min
17.3
17.1
45
35
30
15
2
Typ
18
Max
18.7
18.9
300
250
170
85
3.5
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
27V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L18) and T
j
=
0 to 100°C
(AN78L18M)
•
AN78L20, AN78L20M (20V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
22.5 to 35V, I
O
=
1 to 70mA
V
I
=
22.5 to 35V, T
j
=
25°C
V
I
=
23 to 35V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
23 to 35V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
23 to 33V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
34
170
44
1.7
140
−1.7
Conditions
Min
19.2
19
50
40
35
17
2
Typ
20
Max
20.8
21
300
250
180
90
3.5
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
29V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L20) and T
j
=
0 to 100°C
(AN78L20M)
SFF00005CEB
7
PANASONIC [ PANASONIC SEMICONDUCTOR ]
