AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L12, AN78L12M (12V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
14.5 to 27V, I
O
=
1 to 70mA
V
I
=
14.5 to 27V, T
j
=
25°C
V
I
=
15 to 27V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
15 to 27V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
15 to 25V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
40
80
50
1.7
140
−1
Conditions
Min
11.5
11.4
120
100
20
10
2
Typ
12
Max
12.5
12.6
250
200
100
50
3.5
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
19V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L12) and T
j
=
0 to 100°C
(AN78L12M)
•
AN78L15, AN78L15M (15V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
17.5 to 30V, I
O
=
1 to 70mA
V
I
=
17.5 to 30V, T
j
=
25°C
V
I
=
18 to 30V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
18 to 30V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
18 to 28V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
38
90
48
1.7
140
−1.3
Conditions
Min
14.4
14.25
130
110
25
12
2
Typ
15
Max
15.6
15.75
300
250
150
75
3.5
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
23V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L15) and T
j
=
0 to 100°C
(AN78L15M)
6
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