AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L09, AN78L09M (9V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
11.5 to 24V, I
O
=
1 to 70mA
V
I
=
11.5 to 24V, T
j
=
25°C
V
I
=
12 to 24V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
12 to 24V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
12 to 22V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
43
65
53
1.7
140
−
0.85
Conditions
Min
8.64
8.55
90
80
16
8
2
Typ
9
Max
9.35
9.45
190
140
85
45
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
15V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L09) and T
j
=
0 to 100°C
(AN78L09M)
•
AN78L10, AN78L10M (10V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
12.5 to 25V, I
O
=
1 to 70mA
V
I
=
12.5 to 25V, T
j
=
25°C
V
I
=
13 to 25V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
13 to 25V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
13 to 23V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
42
70
52
1.7
140
−
0.9
Conditions
Min
9.6
9.5
100
90
17
9
2
Typ
10
Max
10.4
10.5
210
160
90
45
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
16V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L10) and T
j
=
0 to 100°C
(AN78L10M)
SFF00005CEB
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