AN78Lxx/AN78LxxM Series
I
Electrical Characteristics at T
a
=
25°C (continued)
•
AN78L05, AN78L05M (5V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
7.5 to 20V, I
O
=
1 to 70mA
V
I
=
7.5 to 20V, T
j
=
25°C
V
I
=
8 to 20V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
8 to 20V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
8 to 18V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
47
40
57
1.7
140
−
0.65
Conditions
Min
4.8
4.75
55
45
11
5
2
Typ
5
Max
5.2
5.25
150
100
60
30
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
10V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L05) and T
j
=
0 to 100°C
(AN78L05M)
•
AN78L06, AN78L06M (6V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
=
8.5 to 21V, I
O
=
1 to 70mA
V
I
=
8.5 to 21V, T
j
=
25°C
V
I
=
9 to 21V, T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
=
9 to 21V, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz
V
I
=
9 to 19V, I
O
=
40mA, f
=
120Hz
T
j
=
25°C
T
j
=
25°C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125°C
46
50
56
1.7
140
−
0.7
Conditions
Min
5.76
5.7
60
50
12
5.5
2
Typ
6
Max
6.24
6.3
155
105
65
35
3
1
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
11V, I
O
=
40mA, C
I
=
0.33µF, C
O
=
0.1µF, T
j
=
0 to 125°C (AN78L06) and T
j
=
0 to 100°C
(AN78L06M)
SFF00005CEB
3
PANASONIC [ PANASONIC SEMICONDUCTOR ]
