LM337
Figure 2. Load Regulation and
∆I
Adj/Load Test Circuit
* Pulse testing required.
1% Duty Cycle is suggested.
CO +
Cin
1.0
µF
IAdj
Adjust
–VI
Vin
Vout
IL
Load Regulation (% VO) =
R1
120
*
RL
(max
Load)
1.0
µF
R2
1%
LM337
–VO (min Load)
–VO (max Load)
VO (min Load) – VO (max Load)
x 100
VO (min Load)
Load Regulation (mV) = VO (min Load) – VO (max Load)
Figure 3. Standard Test Circuit
R2
1%
+
1.0
µF
RL
VI
Cin
1.0
µF
CO
VO
IAdj
Adjust
Vin
VO
– 1 R1
Vref
This assumes IAdj is negligible.
R2 =
LM337
Vout
Vref
R1
120
IL
To Calculate R2:
* Pulse testing required.
*
1% Duty Cycle is suggested.
Figure 4. Ripple Rejection Test Circuit
+
R2
Cin
1.0
µF
Adjust
Vin
LM337
R1
Vout
120
D1*
1%
CAdj
10µF
CO
1N4002
+
1.0
µF
RL
VO
Vout = –1.25 V
14.3 V
4.3 V
f = 120 Hz
* D1 Discharges CAdj if output is shorted to Ground.
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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola
data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals”
must be validated for each customer application by customer’s technical experts. Motorola does not convey any license under its patent rights nor the rights of
others. Motorola products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other
applications intended to support or sustain life, or for any other application in which the failure of the Motorola product could create a situation where personal injury
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Motorola was negligent regarding the design or manufacture of the part. Motorola and
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4
MOTOROLA ANALOG IC DEVICE DATA
ONSEMI [ ON SEMICONDUCTOR ]
