CAT93C86 (Rev. C)
ABSOLUTE MAXIMUM RATINGS
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground
V
CC
with Respect to Ground
Package Power Dissipation Capability (T
A
= 25ºC)
Lead Soldering Temperature (10 seconds)
Output Short Circuit Current
(3)
(2)
Ratings
–55 to +125
–65 to 150
-2.0 to +V
CC
+2.0
-2.0 to +7.0
1.0
300
100
Units
ºC
ºC
V
V
W
ºC
mA
RELIABILITY CHARACTERISTICS
Symbol
N
END(4)
T
DR(4)
V
ZAP(4)
I
LTH(4)(5)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Units
Cycles/Byte
Years
V
mA
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +5.5V unless otherwise specified.
Symbol
I
CC1
I
CC2
I
SB1
I
SB2
I
LI
I
LO
V
IL1
V
IH1
V
IL2
V
IH2
V
OL1
V
OH1
V
OL2
V
OH2
Parameter
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16Mode)
Input Leakage Current
Output Leakage Current
(Including ORG pin)
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Test Conditions
f
SK
= 1MHz; V
CC
= 5.0V
f
SK
= 1MHz; V
CC
= 5.0V
CS = 0V ORG = GND
CS = 0V ORG = Float or V
CC
V
IN
= 0V to V
CC
V
OUT
= 0V to V
CC
, CS = 0V
4.5V
≤
V
CC
< 5.5V
4.5V
≤
V
CC
< 5.5V
1.8V
≤
V
CC
< 4.5V
1.8V
≤
V
CC
< 4.5V
4.5V
≤
V
CC
< 5.5V; I
OL
= 2.1mA
4.5V
≤
V
CC
< 5.5V; I
OH
= -400µA
1.8V
≤
V
CC
< 4.5V; I
OL
= 1mA
1.8V
≤
V
CC
< 4.5V; I
OH
= -100µA
Min
Typ
Max
3
500
10
Units
mA
µA
µA
µA
µA
µA
V
V
V
V
V
V
V
V
0
10
1
1
-0.1
2
0
V
CC
x 0.7
2.4
0.8
V
CC
+ 1
V
CC
x 0.2
V
CC
+ 1
0.4
0.2
V
CC
- 0.2
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this
specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20ns. Maximum DC
voltage on output pins is V
CC
+0.5V, which may overshoot to V
CC
+2.0V for periods of less than 20ns.
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) These parameters are tested initially and after a design or process change that affects the parameter.
(5) Latch-up protection is provided for stresses up to 100 mA pn address and data pins from –1V to V
CC
+1V.
Doc. No. MD-1091 Rev. R
2
© 2008 SCILLC. All rights reserved
Characteristics subject to change without notice
ONSEMI [ ON SEMICONDUCTOR ]
