ML674000
Oki Semiconductor
Analog-to-Digital Converter Characteristics
(VDD_CORE = 2.50 V, VDD_IO = 3.3 V, Ta = 25°C)
Item
Symbol
n
Conditions
Minimum
Typical Maximum
Unit
Resolution
—
—
—
—
—
—
5
—
±3
±3
±3
±3
—
—
10
—
bit
Linearity error
EL
Analog input source
impedance
Differential linearity error
Zero scale error
Full scale error
Conversion time
Throughput
ED
—
LSB
EZS
—
Ri ≤ 1kΩ
EFS
—
tCONV
—
—
—
µs
10
200
kHz
Note: VDD_IO and AVDD should be supplied separately.
•
Definition of Terms
(1) Resolution: Minimum input analog value recognized. For 10-bit resolution, this is (VREF – Aground) ÷
1024.
(2) Linearity error: Difference between the theoretical and actual conversion characteristics. (Note that it does
not include quantization error.) The theoretical conversion characteristic divides the voltage range
between VREF and AGND into 1024 equal steps.
(3) Differential linearity error: Difference between the theoretical and actual input voltage change producing a
1-bit change in the digital output anywhere within the conversion range. This is an indicator of conversion
characteristic smoothness. The theoretical value is (VREF – Aground) ÷ 1024.
(4) Zero scale error: Difference between the theoretical and actual conversion characteristics at the point
where the digital output switches from “0x000” to “0x001.”
(5) Full scale error: Difference between the theoretical and actual conversion characteristics at the point
where the digital output switches from “0x3FE” to “0x3FF.”
20/22