FEDL66517-01
1
Semiconductor
ML66517 Family
A/D Converter Characteristics
(Ta = –40 to +85°C, VDD = VREF = 4.5 to 5.5 V, AGND = GND = 0 V)
Parameter
Resolution
Symbol
n
Condition
Refer to measurement
circuit 1
Min.
—
Typ.
10
—
Max.
—
Unit
Bit
Linearity error
EL
—
±3
Analog input source
impedance RI ≤ 5 kΩ
Differential linearity error
Zero scale error
Full-scale error
ED
—
—
±2
EZS
EFS
—
—
+3
LSB
t
CONV = 10.7 µs
—
—
–3
Refer to measurement
circuit 2
Cross talk
ECT
—
—
—
±1
—
Set according to
ADTM set data
Conversion time
tCONV
10.7
µs/ch
VREF
VDD
+5 V
Reference
voltage
+
+
47
µF
0.1
µF
0.1
µF
47
µF
RI
–
+
AI0 to AI7*
AGND
GND
0 V
Analog input
CI
RI (impedance of analog input source) ≤5 kΩ
CI 0.1 µF
*AI4 to AI7 for the ML66Q515/ML66514
Measurement Circuit 1
5 kΩ
Cross talk is the difference
between the A/D conversion
–
+
AI0
AI1
results when the same
analog input is applied to AI0
through AI7 and the A/D
conversion results of the
circuit to the left.
Analog input
0.1 µF
to
AI7*
*AI4 to AI7 for the ML66Q515/ML66514
VREF or AGND
Measurement Circuit 2
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