NXP Semiconductors
BAV102; BAV103
Single general-purpose switching diodes
300
I
F
(mA)
200
mbh278
300
V
R
(V)
(1)
mgl588
200
(2)
100
100
0
0
100
T
amb
(°C)
200
0
0
100
T
amb
(°C)
200
FR4 PCB, standard footprint
FR4 PCB, standard footprint
(1) BAV103
(2) BAV102
Fig 5. Forward current as a function of ambient
temperature; derating curve
Fig 6. Reverse voltage as a function of ambient
temperature; derating curve
8. Test information
t
r
D.U.T.
R
S
= 50
Ω
V = V
R
+
I
F
×
R
S
I
F
SAMPLING
OSCILLOSCOPE
R
i
= 50
Ω
V
R
mga881
t
p
t
10 %
+
I
F
trr
t
90 %
input signal
output signal
(1)
(1) I
R
= 1 mA
Fig 7. Reverse recovery time test circuit and waveforms
BAV102_BAV103_3
© NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 03 — 16 August 2007
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