Philips Semiconductors
Product specification
Quad 2-input AND gate
74HC08; 74HCT08
Family 74HCT08
At recommended operating conditions; voltages are referenced to GND (ground = 0).
TEST CONDITIONS
SYMBOL
PARAMETER
MIN.
TYP.
MAX. UNIT
OTHER
VCC (V)
Tamb = 25 °C
VIH
VIL
HIGH-level input voltage
LOW-level input voltage
HIGH-level output voltage
4.5 to 5.5 2.0
1.6
−
V
V
4.5 to 5.5
−
1.2
0.8
VOH
VI = VIH or VIL
IO = −20 µA
4.5
4.5
4.4
4.5
−
−
V
V
IO = −4.0 mA
VI = VIH or VIL
IO = 20 µA
3.84
4.32
VOL
LOW-level output voltage
4.5
4.5
5.5
5.5
−
−
−
−
0
0.1
V
IO = 4.0 mA
0.15
−
0.26
±0.1
±0.5
V
ILI
input leakage current
VI = VCC or GND
µA
µA
IOZ
3-state output OFF current
VI = VIH or VIL;
VO = VCC or GND;
IO = 0
−
ICC
quiescent supply current
VI = VCC or GND; 5.5
IO = 0
−
−
−
2
µA
µA
∆ICC
additional supply current per input VI = VCC − 2.1 V;
4.5 to 5.5
60
216
IO = 0
Tamb = −40 to +85 °C
VIH
VIL
HIGH-level input voltage
4.5 to 5.5 2.0
−
−
−
V
V
LOW-level input voltage
HIGH-level output voltage
4.5 to 5.5
−
0.8
VOH
VI = VIH or VIL
IO = −20 µA
4.5
4.5
4.4
−
−
−
−
V
V
IO = −4.0 mA
VI = VIH or VIL
IO = 20 µA
3.84
VOL
LOW-level output voltage
4.5
4.5
5.5
5.5
−
−
−
−
−
−
−
−
0.1
V
IO = 4.0 mA
0.33
±1.0
±5.0
V
ILI
input leakage current
VI = VCC or GND
µA
µA
IOZ
3-state output OFF current
VI = VIH or VIL;
VO = VCC or GND;
IO = 0
ICC
quiescent supply current
VI = VCC or GND; 5.5
IO = 0
−
−
−
−
20
µA
µA
∆ICC
additional supply current per input VI = VCC − 2.1 V;
4.5 to 5.5
270
IO = 0
2003 Jul 25
9
NXP [ NXP ]
