Command interface
M29W320ET, M29W320EB
Table 6.
Program, Erase times and Program, Erase Endurance cycles
Parameter
Min
Typ(1)(2)
Max(2)
Unit
Chip Erase
40
200(3)
6(3)
s
Block Erase (64 Kbytes)
0.8
s
µs
Erase Suspend Latency time
Program (byte or word)
50(4)
10
10
40
20
10
200(4)
200(3)
200(3)
100(3)
100(3)
µs
Double word Program (byte or word)
Chip Program (byte by byte)
Chip Program (word by word)
Chip Program (Quadruple byte or Double word)
Program/Erase Cycles (per Block)
Data Retention
µs
s
s
s
100,000
20
cycles
years
1. Typical values measured at room temperature and nominal voltages.
2. Sampled, but not 100% tested.
3. Maximum value measured at worst case conditions for both temperature and VCC after 100,00 program/erase cycles.
4. Maximum value measured at worst case conditions for both temperature and VCC
.
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