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GE28F640L18B105 参数 Datasheet PDF下载

GE28F640L18B105图片预览
型号: GE28F640L18B105
PDF下载: 下载PDF文件 查看货源
内容描述: [Flash, 4MX16, 105ns, PBGA56, 0.75 MM PITCH, VFBGA-56]
分类和应用: 内存集成电路
文件页数/大小: 94 页 / 1222 K
品牌: NUMONYX [ NUMONYX B.V ]
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28F640L18, 28F128L18, 28F256L18  
Figure 24. Reset Operation Waveforms  
P1  
P2  
P2  
P3  
R5  
VIH  
VIL  
(
A) Reset during  
read mode  
RST# [P]  
RST# [P]  
RST# [P]  
VCC  
Abort  
Complete  
R5  
(B) Reset during  
VIH  
VIL  
program or block erase  
P1  
P2  
Abort  
Complete  
R5  
(C) Reset during  
VIH  
VIL  
program or block erase  
P1  
P2  
VCC  
0V  
(D) VCC Power-up to  
RST# high  
12.6  
AC Test Conditions  
Figure 25. AC Input/Output Reference Waveform  
VCCQ  
Input VCCQ/2  
Test Points  
VCCQ/2 Output  
0V  
NOTE: AC test inputs are driven at V  
for Logic "1" and 0.0 V for Logic "0." Input/output timing begins/ends  
CCQ  
at V  
/2. Input rise and fall times (10% to 90%) < 5 ns. Worst case speed occurs at V = V Min.  
CCQ  
CC CC  
Figure 26. Transient Equivalent Testing Load Circuit  
VCCQ  
R1  
Device  
Under Test  
Out  
CL  
R2  
NOTES:  
1. See the following table for component values.  
2. Test configuration component value for worst case speed conditions.  
3. C includes jig capacitance.  
L
Table 17. Test configuration component value for worst case speed conditions  
Test Configuration  
1.35 V Standard Test  
1.7 V Standard Test  
C
(pF)  
R
()  
R ()  
2
L
1
30  
30  
13.5K  
16.7K  
13.5K  
16.7K  
Datasheet  
63