Absolute Maximum Ratings
(Note 1)
If Military Aerospace specified devices are required
please contact the National Semiconductor Sales
Office Distributors for availability and specifications
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
Ceramic
Plastic
V
CC
Pin Potential to
Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Any Output
in the Disabled or
Power-Off State
in the HIGH State
Current Applied to Output
in LOW State (Max)
b
65 C to
a
150 C
b
55 C to
a
125 C
b
55 C to
a
175 C
b
55 C to
a
150 C
b
0 5V to
a
7 0V
b
0 5V to
a
7 0V
b
30 mA to
a
5 0 mA
b
150 mA
DC Latchup Source Current
OE Pin
(Across Comm Operating Range) Other Pins
b
500 mA
Over Voltage Latchup (I O)
10V
Note 1
Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired Functional operation under
these conditions is not implied
Note 2
Either voltage limit or current limit is sufficient to protect inputs
Recommended Operating
Conditions
Free Air Ambient Temperature
Military
Commercial
Supply Voltage
Military
Commercial
Minimum Input Edge Rate
Data Input
Enable Input
b
55 C to
a
125 C
b
40 C to
a
85 C
a
4 5V to
a
5 5V
a
4 5V to
a
5 5V
b
0 5V to
a
5 5V
b
0 5V to V
CC
twice the rated I
OL
(mA)
(DV
Dt)
50 mV ns
20 mV ns
DC Electrical Characteristics
Symbol
V
IH
V
IL
V
CD
V
OH
Parameter
Input HIGH Voltage
Input LOW Voltage
Input Clamp Diode Voltage
Output HIGH Voltage
54ABT 74ABT
54ABT
74ABT
54ABT
74ABT
25
20
20
0 55
0 55
5
5
7
b
5
b
5
ABT373
Min
20
08
b
1 2
Typ
Max
Units
V
V
V
V
V
CC
Conditions
Recognized HIGH Signal
Recognized LOW Signal
Min
Min
I
IN
e b
18 mA
I
OH
e b
3 mA
I
OH
e b
24 mA
I
OH
e b
32 mA
I
OL
e
48 mA
I
OL
e
64 mA
V
IN
e
2 7V (Note 2)
V
IN
e
V
CC
V
IN
e
7 0V
V
IN
e
0 5V (Note 2)
V
IN
e
0 0V
I
ID
e
1 9
mA
All Other Pins Grounded
V
OL
I
IH
I
BVI
I
IL
V
ID
I
OZH
I
OZL
I
OS
I
CEX
I
ZZ
I
CCH
I
CCL
I
CCZ
I
CCT
Output LOW Voltage
Input HIGH Current
Input HIGH Current Breakdown Test
Input LOW Current
Input Leakage Test
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Output High Leakage Current
Bus Drainage Test
Power Supply Current
Power Supply Current
Power Supply Current
Additional I
CC
Input
V
mA
mA
mA
V
Min
Max
Max
Max
00
4 75
50
b
50
b
100
b
275
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
0
b
5 5V V
OUT
e
2 7V OE
e
2 0V
0
b
5 5V V
OUT
e
0 5V OE
e
2 0V
Max
Max
00
Max
Max
Max
V
OUT
e
0 0V
V
OUT
e
V
CC
V
OUT
e
5 5V All Others GND
All Outputs HIGH
All Outputs LOW
OE
e
V
CC
All Others at V
CC
or GND
V
I
e
V
CC
b
2 1V
Enable Input V
I
e
V
CC
b
2 1V
Data Input V
I
e
V
CC
b
2 1V
All Others at V
CC
or GND
Outputs Open LE
e
V
CC
OE
e
GND (Note 1)
One Bit Toggling 50% Duty Cycle
50
100
50
30
50
Outputs Enabled
Outputs TRI-STATE
Outputs TRI-STATE
No Load
25
25
25
Max
I
CCD
Dynamic I
CC
(Note 2)
0 12
mA
MHz
Max
Note 1
For 8 bits toggling I
CCD
k
0 8 mA MHz
Note 2
Guaranteed but not tested
3
NSC [ NATIONAL SEMICONDUCTOR ]
