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54ABT573E-QML 参数 Datasheet PDF下载

54ABT573E-QML图片预览
型号: 54ABT573E-QML
PDF下载: 下载PDF文件 查看货源
内容描述: 八D型锁存器与三态输出 [Octal D-Type Latch with TRI-STATE Outputs]
分类和应用: 总线驱动器总线收发器锁存器逻辑集成电路信息通信管理
文件页数/大小: 12 页 / 407 K
品牌: NSC [ National Semiconductor ]
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Absolute Maximum Ratings (Note 1)  
Over Voltage Latchup (I/O)  
10V  
Storage Temperature  
Ambient Temperature under Bias  
Junction Temperature under Bias  
Ceramic  
−65˚C to +150˚C  
Recommended Operating  
Conditions  
Free Air Ambient Temperature  
Military  
−55˚C to +125˚C  
−55˚C to +175˚C  
VCC Pin Potential to  
Ground Pin  
−55˚C to +125˚C  
−0.5V to +7.0V  
−0.5V to +7.0V  
Supply Voltage  
Military  
Input Voltage (Note 2)  
Input Current (Note 2)  
Voltage Applied to Any Output  
in the Disabled or  
+4.5V to +5.5V  
(V/t)  
−30 mA to +5.0 mA  
Minimum Input Edge Rate  
Data Input  
50 mV/ns  
Enable Input  
20 mV/ns  
Power-Off State  
−0.5V to +5.5V  
−0.5V to VCC  
Note 1: Absolute maximum ratings are values beyond which the device may  
be damaged or have its useful life impaired. Functional operation under these  
conditions is not implied.  
in the HIGH State  
Current Applied to Output  
in LOW State (Max)  
DC Latchup Source Current  
Note 2: Either voltage limit or current limit is sufficient to protect inputs.  
Twice the rated IOL (mA)  
−500 mA  
DC Electrical Characteristics  
Symbol  
Parameter  
ABT573  
Units  
VCC  
Conditions  
Min  
Typ Max  
VIH  
Input HIGH Voltage  
Input LOW Voltage  
2.0  
V
V
V
V
Recognized HIGH Signal  
Recognized LOW Signal  
VIL  
0.8  
=
IIN −18 mA  
VCD  
VOH  
Input Clamp Diode Voltage  
Output HIGH Voltage  
−1.2  
Min  
Min  
=
IOH −3 mA  
54ABT  
54ABT  
54ABT  
2.5  
2.0  
=
IOH −24 mA  
=
IOL 48 mA  
VOL  
IIH  
Output LOW Voltage  
Input HIGH Current  
0.55  
V
Min  
=
VIN 2.7V (Note 4)  
5
5
7
µA  
Max  
=
VIN VCC  
=
VIN 7.0V  
IBVI  
Input HIGH Current  
Breakdown Test  
µA  
µA  
V
Max  
Max  
0.0  
=
VIN 0.5V (Note 4)  
IIL  
Input LOW Current  
−5  
−5  
=
VIN 0.0V  
=
VID  
Input Leakage Test  
4.75  
IID 1.9 µA  
All Other Pins Grounded  
= =  
VOUT 2.7V; OE 2.0V  
IOZH  
IOZL  
IOS  
Output Leakage Current  
Output Leakage Current  
Output Short-Circuit Current  
Output High Leakage Current  
Bus Drainage Test  
50  
−50  
−275  
50  
µA  
µA  
mA  
µA  
µA  
µA  
mA  
µA  
0 − 5.5V  
0 − 5.5V  
Max  
=
=
VOUT 0.5V; OE 2.0V  
=
VOUT 0.0V  
−100  
=
VOUT VCC  
ICEX  
IZZ  
Max  
=
100  
50  
0.0  
VOUT 5.5V; All Others GND  
ICCH  
ICCL  
ICCZ  
Power Supply Current  
Power Supply Current  
Power Supply Current  
Max  
All Outputs HIGH  
All Outputs LOW  
30  
Max  
=
50  
Max  
OE VCC  
All Others at VCC or GND  
=
VI VCC − 2.1V  
ICCT  
Additional ICC/Input  
Outputs Enabled  
Outputs TRI-STATE  
2.5  
2.5  
2.5  
mA  
mA  
mA  
=
Enable Input VI VCC − 2.1V  
Max  
Max  
=
Outputs TRI-STATE  
Data Input VI VCC − 2.1V  
All Others at VCC or GND  
Outputs Open  
ICCD  
Dynamic ICC  
(Note 4)  
No Load  
mA/  
=
=
0.12  
MHz  
OE GND, LE VCC (Note 3)  
One Bit Toggling, 50% Duty Cycle  
<
Note 3: For 8 bits toggling, I  
CCD  
0.8 mA/MHz.  
Note 4: Guaranteed but not tested.  
3
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