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30036-23 参数 Datasheet PDF下载

30036-23图片预览
型号: 30036-23
PDF下载: 下载PDF文件 查看货源
内容描述: 的Geode ™ GXLV处理器系列的低功耗X86集成解决方案 [Geode⑩ GXLV Processor Series Low Power Integrated x86 Solutions]
分类和应用:
文件页数/大小: 247 页 / 4117 K
品牌: NSC [ National Semiconductor ]
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Signal Definitions (Continued)  
2.2.5 Power, Ground, and No Connect Signals  
BGA  
SPGA  
Signal Name  
Pin No.  
Pin No.  
Type  
Description  
VSS  
Refer  
to  
Refer  
to  
GND  
Ground Connection  
Table 2-3 Table 2-5  
(Total of  
71)  
(Total of  
50)  
VCC2  
VCC3  
NC  
Refer  
to  
Table 2-3 Table 2-5  
(Total of  
32)  
Refer  
to  
PWR  
PWR  
2.2V, 2.5V, or 2.9V (Nominal) Core Power Connection  
3.3V (Nominal) I/O Power Connection  
(Total of  
32)  
Refer  
to  
Table 2-3 Table 2-5  
(Total of  
32)  
Refer  
to  
(Total of  
18)  
D26,  
E24,  
AC5  
E37,  
F36, Q5,  
X2, Z2,  
AM36  
No Connection  
A line designated as NC must be left disconnected.  
2.2.6 Internal Test and Measurement Signals  
BGA SPGA  
Signal Name  
Pin No. Pin No.  
Type  
Description  
Float  
FLT#  
AC2  
AJ3  
I
Float forces the GXLV processor to float all outputs in the high-  
impedance state and to enter a power-down state.  
RW_CLK  
TEST[3:0]  
AE6  
AL11  
O
O
Raw Clock  
This output is the GXLV processor clock. This debug signal can  
be used to verify clock operation.  
B22,  
A23,  
B21,  
C21  
D28,  
B32,  
D26,  
A33  
SDRAM Test Outputs  
These outputs are used for internal debug only.  
TCLK  
TDI  
J2  
(PU)  
P4  
(PU)  
I
I
Test Clock  
JTAG test clock.  
This pin is internally connected to a weak (>20-kohm) pull-up  
resistor.  
D2  
F4  
Test Data Input  
(PU)  
(PU)  
JTAG serial test-data input.  
This pin is internally connected to a weak (>20-kohm) pull-up  
resistor.  
TDO  
F1  
J1  
O
Test Data Output  
JTAG serial test-data output.  
Revision 1.1  
39  
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