Absolute Maximum Ratings (Note 2)
ESD (Note 3)
≥2000V
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications. Above
which the useful life may be impaired.
Recommended Operating
Conditions
Case Temperature (TC)
Military
Storage Temperature (TSTG
)
−65˚C to +150˚C
−55˚C to +125˚C
−5.7V to −4.2V
Maximum Junction Temperature (TJ)
Ceramic
Supply Voltage (VEE
)
+175˚C
−7.0V to +0.5V
VEE to +0.5V
−50 mA
Note 2: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Output Current (DC Output HIGH)
Military Version
DC Electrical Characteristics
=
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND, TC −55˚C to +125˚C
Symbol
Parameter
Min
Max
Units
mV
mV
mV
mV
mV
mV
mV
mV
mV
TC
0˚C to +125˚C
−55˚C
Conditions
Notes
VOH
Output HIGH Voltage −1025 −870
−1085 −870
=
VIN VIH (Max)
Loading with
(Notes 4, 5,
6)
VOL
Output LOW Voltage
−1830 −1620
−1830 −1555
0˚C to +125˚C
−55˚C
or VIL (Min)
50Ω to −2.0V
VOHC Output HIGH Voltage −1035
−1085
0˚C to +125˚C
−55˚C
=
VIN VIH (Min)
Loading with
(Notes 4, 5,
6)
VOLC
VIH
VIL
IIL
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
−1610
−1555
0˚C to +125˚C
−55˚C
or VIL (Max)
50Ω to −2.0V
−1165 −870
−55˚C to
+125˚C
Guaranteed HIGH Signal
for ALL Inputs
(Notes 4, 5,
6, 7)
−1830 −1475
0.50
mV
µA
−55˚C to
+125˚C
Guaranteed LOW Signal
for ALL Inputs
(Notes 4, 5,
6, 7)
=
VEE −4.2V
−55˚C to
+125˚C
(Notes 4, 5,
6)
=
VIN VIL (Min)
IIH
Input HIGH Current
S0, S1
220
350
340
430
320
500
490
630
E1, E2
µA
0˚C to +125˚C
=
VEE −5.7V
D
na–Dnd
=
VIN VIH (Max)
MR
(Notes 4, 5,
6)
S0, S1
E1, E2
µA
−55˚C
D
na–Dnd
MR
IEE
Power Supply Current
−95
−32
mA
−55˚C to +125˚C Inputs Open
(Notes 4, 5,
6)
Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 5: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C Temp., Subgroups 1, 2, 3, 7, and 8.
Note 6: Sample tested (Method 5005, Table 1) on each Mfg. lot at +25˚, +125˚C, and −55˚C Temp., Subgroups 1, 2, 3, 7, and 8.
Note 7: Guaranteed by applying specified input condition and testing V /V
.
OH OL
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