欢迎访问ic37.com |
会员登录 免费注册
发布采购

100343D 参数 Datasheet PDF下载

100343D图片预览
型号: 100343D
PDF下载: 下载PDF文件 查看货源
内容描述: 低功耗的8位锁存器 [Low Power 8-Bit Latch]
分类和应用: 锁存器
文件页数/大小: 8 页 / 158 K
品牌: NSC [ National Semiconductor ]
 浏览型号100343D的Datasheet PDF文件第1页浏览型号100343D的Datasheet PDF文件第2页浏览型号100343D的Datasheet PDF文件第3页浏览型号100343D的Datasheet PDF文件第5页浏览型号100343D的Datasheet PDF文件第6页浏览型号100343D的Datasheet PDF文件第7页浏览型号100343D的Datasheet PDF文件第8页  
Military Version  
AC Electrical Characteristics (Continued)  
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND  
=
=
=
Symbol  
Parameter  
TC −55˚C  
TC +25˚C  
TC +125˚C Units  
Conditions  
Notes  
Min  
Max  
Min  
Max  
Min  
Max  
tPLH  
tPHL  
tTLH  
tTHL  
ts  
Propagation Delay  
LE, E to Output  
0.90  
3.40  
1.0  
3.10  
1.10  
3.90  
ns  
ns  
(Notes 8, 9,  
10, 12)  
Figures 1, 2, 3  
Figures 1, 3  
Transition Time  
0.40  
2.50  
0.40  
2.40  
0.40  
2.70  
(Note 11)  
20% to 80%, 80% to 20%  
Setup Time  
D0–D7  
0.60  
1.50  
2.40  
0.60  
1.50  
2.40  
0.60  
1.70  
2.40  
ns  
ns  
ns  
Figures 1, 4  
Figures 1, 4  
Figures 1, 4  
(Note 11)  
(Note 11)  
(Note 11)  
th  
Hold Time  
D0–D7  
LE, E  
t
pw(H)  
Pulse Width HIGH  
Note 8: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately  
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.  
Note 9: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.  
Note 10: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.  
Note 11: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).  
Note 12: The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.  
Test Circuitry  
DS100298-6  
=
=
−2.5V  
Note 13:  
V , V  
CC CCA  
+2V, V  
EE  
=
Note 14: L1 and L2 equal length 50impedance lines  
=
R
50terminator internal to scope  
T
Decoupling 0.1 µF from GND to V and V  
CC EE  
All unused outputs are loaded with 50to GND  
=
C
Fixture and stray capacitance 3 pF  
L
FIGURE 1. AC Test Circuit  
Switching Waveforms  
DS100298-7  
FIGURE 2. Propagation Delays  
www.national.com  
4