DC Electrical Characteristics (Continued)
Note 5: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 6: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 7: Guaranteed by applying specified input condition and testing V /V
.
OH OL
AC Electrical Characteristics
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND
=
=
=
Symbol
Parameter
TC −55˚C
TC +25˚C
TC +125˚C
Units
ns
Conditions
Notes
Min
Max
Min Max
Min
Max
tPLH
tPHL
tPLH
tPHL
tS G–G
tTLH
tTHL
Propagation Delay CLKIN,
CLKIN to CLK(1–4), CLK(1–4)
Propagation Delay, TCLK
to CLK(1–4), CLK(1–4)
0.58
0.88
0.63 0.88 0.72
0.30 1.50 0.40
1.02
Figures 1, 2
(Notes 8, 9,
10)
0.30
0.30
1.60
1.70
ns
Skew Gate to Gate (Note 12)
Transition Time
120
100
120
ps
ns
(Note 10)
0.90
0.25 0.85 0.20
0.85
20% to 80%, 80% to 20%
Note 8: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C, then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 9: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 10: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 11: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data).
Note 12: Maximum output skew for any one device.
DS100319-3
Note 13: Shown for testing CLKIN to CLK1 in the differential mode.
=
Note 14: L1, L2, L3 and L4 equal length 50Ω impedance lines.
Note 15: All unused inputs and outputs are loaded with 50Ω in parallel with ≤3 pF to GND.
Note 16: Scope should have 50Ω input terminator internally.
FIGURE 1. AC Test Circuit
3
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