CF5074A
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement Circuit 4
I
XT
A
VDD
XT
XTN
When measuring
V
OL
VC
VDD
When measuring
V
OH
INHN
TESN
VSS
Q
V
XTN
V
VC
VSS
R
VC
1 =
R
VC
2 =
R
VC
3 =
A
V
(V
DD
−
V
XTN
)
I
XT
(V
DD
−
V
XT
)
I
XTN
V
XTN
I
XT
I
XTN
A
XT
VDD
Measurement Circuit 2
V
XT
V
XTN
VC
VSS
A
VDD
XT
X'tal
XTN
VC
VSS
Q
INHN
Measurement Circuit 5
V
C
= 0.5V
DD
, INHN = open, crystal oscillation
Signal
Generator
C1
XT
R1
VC
VDD
INHN
Q
Measurement Circuit 3
VSS
VDD
V
DD
(VR
UP
= V
SS
)
IR
UP
(V
DD
−
0.7V
DD
)
(VR
UP
= 0.7V
DD
)
R
UP
2 =
IR
UP
R
UP
1 =
INHN
XT input signal: 10MHz, 1.0Vp-p
C1 = 0.001µF, R1 = 50Ω, V
C
= 0.5V
DD
A
IR
UP
Measurement Circuit 6
VC
VSS
V
VR
UP
VDD
V
C
= 0.5V
DD
VC
VSS
INHN
Q
A
V
C
= 1/2V
DD
SEIKO NPC CORPORATION —6