CF5020 series
3V operation
V
DD
= 2.7 to 3.6V, V
SS
= 0V, Ta =
−40
to +85°C unless otherwise noted.
Rating
Parameter
HIGH-level output voltage
LOW-level output voltage
HIGH-level input voltage
LOW-level input voltage
Output leakage current
Symbol
V
OH
V
OL
V
IH
V
IL
I
Z
Condition
min
Q: Measurement cct 1, V
DD
= 2.7V, I
OH
= 8mA
Q: Measurement cct 2, V
DD
= 2.7V, I
OL
= 8mA
INHN
INHN
Q: Measurement cct 2, INHN = LOW
V
OH
= V
DD
V
OL
= V
SS
C
L
= 15pF
f = 90MHz
CF5020ALA
C
L
= 30pF
f = 90MHz
C
L
= 15pF
f = 125MHz
Current consumption
I
DD
Measurement cct 3,
load cct 1,
INHN = open
CF5020ALB
C
L
= 30pF
f = 125MHz
C
L
= 15pF
f = 135MHz
CF5020ALC
C
L
= 30pF
f = 125MHz
CF5020ALD
Standby current
INHN pull-up resistance
I
ST
R
UP1
R
UP2
CF5020ALA
AC feedback resistance
R
f1
Design value.
A monitor pattern on a wafer is tested.
CF5020ALB
CF5020ALC
CF5020ALD
DC feedback resistance
R
f2
Measurement cct 5
CF5020ALA
Oscillator amplifier output
resistance
R
D
Design value.
A monitor pattern on a wafer is tested.
CF5020ALB
CF5020ALC
CF5020ALD
AC feedback capacitance
C
f
Design value. A monitor pattern on a wafer is tested.
CF5020ALA
C
G
Design value.
A monitor pattern on a wafer is tested.
CF5020ALB
CF5020ALC
CF5020ALD
Built-in capacitance
CF5020ALA
C
D
Design value.
A monitor pattern on a wafer is tested.
CF5020ALB
CF5020ALC
CF5020ALD
5.95
2.55
2.55
4.25
7
3
3
5
8.05
3.45
3.45
5.75
pF
pF
pF
pF
Measurement cct 3, INHN = LOW
Measurement cct 4
50
2.12
3.82
2.80
1.87
50
170
48.4
48.4
48.4
8.5
3.40
2.55
0.85
0.85
100
2.5
4.5
3.3
2.2
100
200
57
57
57
10
4
3
1
1
150
2.88
5.18
3.80
2.53
150
230
65.6
65.6
65.6
11.5
4.60
3.45
1.15
1.15
kΩ
kΩ
kΩ
kΩ
kΩ
kΩ
Ω
Ω
Ω
Ω
pF
pF
pF
pF
pF
C
L
= 15pF
f = 170MHz
–
–
–
2
40
40
–
4
100
100
5
8
mA
mA
µA
MΩ
–
–
40
30
100
70
mA
mA
–
–
25
25
60
60
mA
mA
2.2
–
0.7V
DD
–
–
–
–
typ
2.4
0.3
–
–
–
–
20
max
–
0.4
–
0.3V
DD
10
10
50
V
V
V
V
µA
µA
mA
Unit
NIPPON PRECISION CIRCUITS INC.—6