5042 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement Circuit 4
Parameters: I , I , Duty, t , t
Parameters: I
Z
DD ST
r
f
I
I
DD
ST
A
VDD
I
DD: Open
DUTY, tr
ST: Open or Short
VDD
,
tf: Short
V
DD
or
SS
XT
I
Q
A
V
Crystal
Q
IZ
INHN VSS
XTN
INHN VSS
CLOUT = 15pF
I
DD, DUTY, tr
,
I
tf: Open
ST: Short
(Including probe
capacitance)
Note: The AC characteristics are observed using an oscilloscope on
pin Q.
Measurement Circuit 5
Parameters: V , V
IH IL
Measurement Circuit 2
Parameters: t
OD
VDD
R
L1 =1kΩ
L2 =1kΩ
VDD
INHN VSS
V
IH
Q
V
VIL
0.001µF
V
Signal
VTT21
XT
INHN VSS
Generator
R
50Ω
V
DD
or
SS
V
Measurement Circuit 6
Parameters: R , R
PU1 PU2
XT input signal: 1Vp-p, sine wave
Measurement Circuit 3
VDD
Parameters: V , V
OH OL
INHN VSS
VDD
VSS
V
DD
R
R
PU1
PU2
=
=
IPU
(VIN = 0V)
A
50Ω
IPU
VIN
V
Q
V
DD 0.7VDD
0.001µF
50Ω
Signal
Generator
(VIN = 0.7VDD
)
XT
IPU
V
V
OH
0.1µF
V
VS
OL
∆V
VOH
VS
VS
VOL
∆V
V
50 × I
adjusted such that ∆V =
OH
V adjusted such that ∆V =
S
50 × I .
OL
S
.
XT input signal: 1Vp-p, sine wave
SEIKO NPC CORPORATION—8
NPC [ NIPPON PRECISION CIRCUITS INC ]
