NanoAmp Solutions, Inc.
Timing Test Conditions
N01L083WC2A
Item
0.1V to 0.9 V
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
CC
CC
5ns
0.5 V
CC
CL = 30pF
o
Operating Temperature
-40 to +85 C
Timing
2.3 - 3.6 V
2.7 - 3.6 V
Item
Symbol
Units
Min.
Max.
Min.
Max.
t
Read Cycle Time
70
55
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
RC
t
Address Access Time
70
70
35
55
55
30
AA
t
Chip Enable to Valid Output
Output Enable to Valid Output
Chip Enable to Low-Z output
Output Enable to Low-Z Output
Chip Disable to High-Z Output
Output Disable to High-Z Output
Output Hold from Address Change
Write Cycle Time
CO
t
OE
t
10
5
10
5
LZ
t
OLZ
t
0
20
20
0
15
15
HZ
t
0
0
OHZ
t
10
70
50
50
40
0
10
55
45
45
35
0
OH
t
WC
t
Chip Enable to End of Write
Address Valid to End of Write
Write Pulse Width
CW
t
AW
t
WP
t
Address Setup Time
AS
t
Write Recovery Time
0
0
WR
t
Write to High-Z Output
20
15
WHZ
t
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
40
0
35
0
DW
t
DH
t
5
5
ns
OW
Stock No. 23033-03 1/02
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.
5
NANOAMP [ NANOAMP SOLUTIONS, INC. ]
