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MUAC4K64-90TDI 参数 Datasheet PDF下载

MUAC4K64-90TDI图片预览
型号: MUAC4K64-90TDI
PDF下载: 下载PDF文件 查看货源
内容描述: [Microprocessor Circuit, CMOS, PQFP100, TQFP-100]
分类和应用: 外围集成电路
文件页数/大小: 32 页 / 276 K
品牌: MUSIC [ MUSIC SEMICONDUCTORS ]
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MUAC Routing CoProcessor (RCP) Family  
Pin Descriptions  
/FF (Full Flag, Output)  
/RESET  
The /FF output indicates when all the memory locations  
have their Validity bits set valid (LOW). When there is at  
least one location with its Validity bit set HIGH, the /FF  
output will be HIGH; when all locations have their  
Validity bits set LOW, and the /FI input is LOW, the /FF  
output will be LOW. If the /FI input is HIGH, the /FF  
output will be HIGH. The state of the /FF line will not  
change until after the rising edge of /E during a Write  
cycle.  
The /RESET input is used to reset the MUAC RCP to a  
known state. When the /RESET line is pulled LOW it  
causes the MUAC RCP to enter its reset state. After power  
is applied to the MUAC RCP, the /RESET line must be  
held LOW for a time equal to or greater than the minimum  
RESET pulse width before the device can operate  
correctly. This pin is internally pulled up.  
TCLK (JTAG Test Clock, Input)  
The TCLK input is the Test Clock input. This pin is  
internally pulled up.  
/FI (Full Input, Input)  
The /FI input receives full information from the next  
higher-priority MUAC RCP in a vertically cascaded  
system to provide system-level full information. When the  
/FI input is LOW the /FF output will be HIGH if there is at  
least one location whose Validity bit is set invalid; when  
all locations have their Validity bits set valid, the /FF  
output goes LOW. When the /FI input is HIGH, the /FF  
output will remain HIGH. The /FF output from one device  
is connected to the /FI input of the next lower-priority  
device to give system-full indication. The /FI pin of the  
highest-priority device must be tied LOW.  
TMS (JTAG Test Mode Select, Input)  
The TMS input is the Test Mode Select input. This pin is  
internally pulled up.  
TDI (JTAG Test Data Input, Input)  
The TDI input is the Test Data input. This pin is internally  
pulled up.  
TDO (JTAG Test Data Output, Output)  
The TCLK output is the Test Data Output. This pin is  
internally pulled up.  
/MM (Multiple Match, Open Drain Output)  
/TRST (JTAG Reset, Input)  
The /MM line indicates that there is a multiple match  
within the system. When the /MI input is HIGH, the /MM  
line is pulled LOW if there are at least two matches within  
the MUAC RCP as a result of the previous Comparison  
cycle; when there are less than two matches, the /MM line  
floats HIGH. When the /MI input is LOW, the /MM line is  
pulled LOW if there are one or more matches within the  
MUAC RCP as a result of the previous Comparison cycle;  
when there are no matches, the /MM line floats HIGH.  
The /MM lines have open-drain outputs, so all /MM lines  
within the system are connected together to give  
system-level multiple match indication. The state of the  
/MM line will not change until after the rising edge of /E  
during a Comparison cycle.  
The /TRST input is the Reset input, and serves to reset the  
Test Access Port circuitry to its reset condition. This pin is  
internally pulled up.  
VDD, VSS (Positive Power Supply, Ground)  
These pins are the main power supply connections to the  
MUAC RCP. VDD must be held at +3.3 Volts and 0.3  
Volts relative to the VSS pin, which is at 0 Volts, system  
reference potential, for correct operation of the device.  
Note: The TCLK, TMS, TDI, TDO, and /TRST lines are defined  
in the IEEE Standard Test Access Port and Boundary-scan  
Architecture IEEE Standard. 1149.1-1990 and IEEE Standard.  
1149.1a-1993.  
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Rev. 4a