■ Specifications and Test Methods
No Item
Specification
Test Method（Ref. Standard:AEC-Q200）
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1 Pre-and Post-Stress
Electrical Test
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.2
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
2 High Temperature
Exposure (Storage)
I.R.(Room Temp.)
More than 500MΩ
Test Temperature
Test Time
Maximum Operating Temperature +/-3℃
1000+/-12h
Post-treatment
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-10%
DF≦0.2
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
3 Temperature Cycling
I.R.(Room Temp.)
More than 1000MΩ
Temperature Cycling
Post-treatment
Per EIA-469
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
No defects or abnormalities.
4 Destructive Physical
Analysis
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.2
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
5 Biased Humidity
I.R.(Room Temp.)
More than 100MΩ
Test Temperature
Test Humidity
Test Time
85+/-3℃
80%RH to 85%RH
1000+/-12h
Test Voltage
The rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)
Charge/discharge current 50mA max.
Post-treatment
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.2
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
6 Operational Life
I.R.(Room Temp.)
More than 100MΩ
Test Temperature
Test Time
Maximum Operating Temperature +/-3℃
1000+/-12h
Test Voltage
100% of the rated voltage
Charge/discharge current 50mA max.
Post-treatment
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
No defects or abnormalities.
Shown in Dimension.
Visual inspection
7 Appearance
8 Dimension
Using Measuring instrument of dimension.
GRT188R72A332KE01-01A
2
MURATA [ muRata ]
