■ Specifications and Test Methods
No Item
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.05
Mounting method
Test Temperature
Test Humidity
Test Time
Solder the capacitor on the test substrate
40+/-2℃
90%RH to 95%RH
500+/-12h
15 High Temperature High
Humidity (Steady)
I.R.
More than 25Ω・F
Test Voltage
Rated Voltage
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.05
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Voltage treatment:Apply the test voltage at the test temperature for 1hour and then let sit for
24+/-2hours at room temperature, then measure.
Maximum Operating Temperature +/-3℃
1000+/-12h
16 Durability
I.R.
More than 50Ω・F
Test Temperature
Test Time
Test Voltage
200% of the rated voltage
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
GRM55MR11H334MA01-01C
4
MURATA [ muRata ]
