■ Specifications and Test Methods
No Item
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.2
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
40+/-2℃
90%RH to 95%RH
500+/-12h
15 High Temperature High
Humidity (Steady)
I.R.
More than 12.5Ω・F
Test Temperature
Test Humidity
Test Time
Test Voltage
Rated Voltage
Charge/discharge current 50mA max.
Post-treatment
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-12.5%
DF≦0.2
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
16 Durability
I.R.
More than 25Ω・F
Test Temperature
Test Time
Maximum Operating Temperature +/-3℃
1000+/-12h
Test Voltage
100% of the rated voltage
Charge/discharge current 50mA max.
Post-treatment
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
GRM32ED71A476ME15-01A
4
MURATA [ muRata ]
