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GRM2195C1H682JA01D 参数 Datasheet PDF下载

GRM2195C1H682JA01D图片预览
型号: GRM2195C1H682JA01D
PDF下载: 下载PDF文件 查看货源
内容描述: 片状独石陶瓷电容器 [Chip Monolithic Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 221 页 / 4341 K
品牌: MURATA [ MURATA MANUFACTURING CO., LTD. ]
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• This PDF catalog has only typical and Test Methods has only typical space for detailed specifications. Therefore, please approve our product specifications approve our product specificationsproduct specifications before ordering.
2. This Specifications specifications because there is no specifications because there is no space for detailed specifications. Therefore, please or transact the approval sheet for or transact the approval sheet for product
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specifications before ordering.
10.12.20
GNM Series Specifications and Test Methods (1)
For General
GRM Series
When no "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (1).
When "*" is added in PNs table, please refer to GNM Series Specifications and Test Methods (2).
Specifications
No.
Item
Temperature
Compensating Type
5C: –55 to +125°C
Test Method
High Dielectric Type
R7, C7: –55 to +125°C
R6: –55 to +85°C
The rated voltage is defined as the maximum voltage that may
be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
P-P
or V
O-P
,
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
Using calipers
No failure should be observed when 300% of the rated voltage
(5C) or 250% of the rated voltage (R7) is applied between the
terminations for 1 to 5 seconds, provided the charge/discharge
current is less than 50mA.
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at 25°C and 75%RH
max. and within 2 minutes of charging.
The capacitance/Q/D.F. should be measured at 25°C at the
frequency and voltage shown in the table.
10V
0.035
max.
6.3V
0.05
max.
Char.
Item
Frequency
Voltage
5C
1±0.1MHz
0.5 to 5Vrms
R7
1±0.1kHz
1.0±0.2Vrms
1
Operating
Temperature
Range
Array
GNM Series
2
Rated Voltage
See the previous pages.
3
4
Appearance
Dimensions
No defects or abnormalities
Within the specified dimensions
5
Dielectric Strength
No defects or abnormalities
Low ESL
LLp Series
6
7
Insulation
Resistance
Capacitance
More than 10,000MΩ or 500Ω · F
(whichever is smaller)
Within the specified tolerance
30pF min.: QU1000
30pF max.:
QU400+20C
C: Nominal
Capacitance (pF)
High-Q
GJM Series
8
Q/
Dissipation Factor
(D.F.)
Char. 25V min. 16V
R7, R6, 0.025 0.035
max.
C7
max.
Char.
Within the
Capacitance
specified tolerance
Change
(Table A)
R7
R6
C7
Within the
specified tolerance
(Table A)
High Frequency
GQM Series
Temp. Reference Cap.
Range
Temp.
Change
–55°C
to +125°C
Within
±15%
–55°C
25°C
to +85°C
Within
–55°C
±22%
to +125°C
Temperature
Coefficient
9
Capacitance
Temperature
Characteristics
The capacitance change should be measured after 5 min. at
each specified temperature stage.
(1) Temperature Compensating Type
The temperature coefficient is determined using the capaci-
tance measured in step 3 as a reference. When cycling the
temperature sequentially from steps 1 through 5, the
capacitance should be within the specified tolerance for the
temperature coefficient and capacitance change as in Table A.
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the
steps 1, 3 and 5 by the cap. value in step 3.
Step
1
2
3
4
5
Temperature (°C)
25±2
–55±3 (for 5C/R7/C7), –30±3 (for F5)
25±2
125±3 (for 5C/R7/C7), 85±3 (for F5)
25±2
Monolithic Microchip
GMA Series
Capacitance
Drift
Within
±0.2%
or
±0.05pF
(whichever is
larger.)
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the above
25°C value over the temperature ranges shown in the table
should be within the specified ranges.
• Initial measurement for high dielectric constant type.
Perform a heat treatment at 150+0/-10°C for one hour and
then set for 24±2 hours at room temperature.
Perform the initial measurement.
For Bonding
GMD Series
No removal of the terminations or other defect should occur.
GNMpp4
b
a
c
d
GNMpp2
b
a
c
Solder the capacitor to the test jig (glass epoxy board) shown in
Fig.1 using a eutectic solder. Then apply 5N force in parallel with
the test jig for 10±1 sec.
The soldering should be done either with an iron or using the
reflow method and should be conducted with care so that the
soldering is uniform and free of defects such as heat shock.
Type
GNM1M2
GNM212
GNM214
GNM314
a
0.5
0.6
0.6
0.8
b
1.6
1.8
2.0
2.5
c
0.32
0.5
0.25
0.4
d
0.32
0.5
0.25
0.4
(in mm)
Fig. 1
Continued on the following page.
10
Adhesive Strength
of Termination
Solder resist
Copper foil
Product Information
Solder resist
Copper foil
70
d