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GRM2195C1H682JA01D 参数 Datasheet PDF下载

GRM2195C1H682JA01D图片预览
型号: GRM2195C1H682JA01D
PDF下载: 下载PDF文件 查看货源
内容描述: 片状独石陶瓷电容器 [Chip Monolithic Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 221 页 / 4341 K
品牌: MURATA [ muRata ]
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• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our  
!Note  
C02E.pdf  
10.12.20  
sales representatives or product engineers before ordering.  
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.  
GA3 Series Specifications and Test Methods  
No.  
1
Item  
Operating  
Specifications  
Test Method  
Y55 to W125D  
Y
Temperature Range  
2
3
Appearance  
No defects or abnormalities  
Visual inspection  
Dimensions  
Within the specified dimensions  
Using calipers and micrometers  
No failure should be observed when voltage in the table is  
applied between the terminations for 60T1 sec., provided the  
charge/discharge current is less than 50mA.  
4
5
Dielectric Strength No defects or abnormalities  
Test Voltage  
DC1075V  
AC1500V (r.m.s.)  
AC2000V (r.m.s.)  
Type GB  
Type GC/GD  
Type GF  
10 impulses of alternating polarity are subjected.  
(5 impulses for each polarity)  
The interval between impulses is 60 sec.  
Applied Pulse: 1.2/50µs  
Pulse Voltage  
(Application: Type  
GD/GF)  
No self healing breakdowns or flash-overs have taken place in  
the capacitor.  
Applied Voltage: 2.5kVo-p  
Insulation Resistance  
(I.R.)  
The insulation resistance should be measured with DC500T50V  
and within 60T5 sec. of charging.  
6
7
More than 6,000MΩ  
Capacitance  
Within the specified tolerance  
The capacitance/Q/D.F. should be measured at a frequency of  
1T0.2kHz (SL char.: 1T0.2MHz) and a voltage of  
AC1T0.2V (r.m.s.)  
Char.  
X7R  
Specification  
D.F.V0.025  
Dissipation  
Factor (D.F.)  
Q
8
QU400W20C*2 (CF30pF)  
SL  
QU1000  
(CU30pF)  
The capacitance measurement should be made at each step  
specified in the Table.  
Step  
Temperature (D)  
1
2
3
4
5
25T2 (20T2 for SL char.)  
Min. Operating Temp.T3  
25T2 (20T2 for SL char.)  
Max. Operating Temp.T2  
25T2 (20T2 for SL char.)  
Char.  
X7R  
Capacitance Change  
Within T15%  
Capacitance  
Temperature  
Characteristics  
Temperature characteristic guarantee is Y55 to W125D  
9
Char.  
SL  
Temperature Coefficient  
W350 to Y1000ppm/D  
SL char. :  
Temperature characteristic guarantee is W20 to W85D  
The capacitance should be measured at even 85D between step  
3 and step 4.  
#Pretreatment for X7R char.  
W 0  
Perform a heat treatment at 150Y10D for 60T5 min. and then  
let sit for 24T2 hrs. at room condition.*1  
Appearance  
No defects or abnormalities  
As in Fig., discharge is made 50 times at 5 sec. intervals from  
the capacitor (Cd) charged at DC voltage of specified.  
I.R.  
More than 1,000MΩ  
R3  
R1  
Discharge  
Test  
10  
R2  
Ct  
(Application:  
Dielectric  
Type GC)  
10kV  
V
Cd  
In accordance with item No.4  
Strength  
Ct: Capacitor under test Cd: 0.001µF  
R1: 1,000R2: 100MR3: Surge resistance  
Solder the capacitor to the testing jig (glass epoxy board) shown  
in Fig. 1.  
Then apply 10N force in the direction of the arrow. The soldering  
should be done using the reflow method and should be  
conducted with care so that the soldering is uniform and free of  
defects such as heat shock.  
Adhesive Strength  
of Termination  
11  
No removal of the terminations or other defect should occur.  
10N, 10T1s  
Glass Epoxy Board  
Fig. 1  
*1 "Room condition" Temperature: 15 to 35D, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa  
*2 "C" expresses nominal capacitance value (pF).  
Continued on the following page.  
196