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C02E.pdf
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• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Only for Camera Flash Circuit Specifications and T st Me hods
GR7 Series Specifications and Test Methods
Continued from the preceding page.
No.
Item
Specifications
Test Method
No marking defects
Solder the capacitor to the testing jig (glass epoxy board) shown
in Fig. 2.
Then apply a force in the direction shown in Fig. 3.
The soldering should be done using the reflow method and
should be conducted with care so that the soldering is uniform
and free of defects such as heat shock.
b
φ4.5
d
c
50
Pressurizing
20
a
speed: 1.0mm/s
11 Deflection
t : 1.6
100
Pressurize
R230
Fig. 2
Flexure=1
LZW
(mm)
2.0Z1.25
3.2Z1.6
Dimension (mm)
Capacitance meter
45 45
a
1.2
2.2
b
c
d
(in mm)
4.0
5.0
1.65
2.0
1.0
Fig. 3
Immerse the capacitor in a solution of ethanol (JIS-K-8101) and
rosin (JIS-K-5902) (25% rosin in weight proportion).
Immerse in solder solution for 2T0.5 sec.
Solderability of
Termination
12
75% of the terminations are to be soldered evenly and continuously.
Immersing speed: 25T2.5mm/s
Temp. of solder: 245T5°C Lead Free Solder (Sn-3.0Ag-0.5Cu)
235T5°C H60A or H63A Eutectic Solder
Appearance
No marking defects
Within T10%
Capacitance
Change
Preheat the capacitor at 120 to 150D for 1 min.
Immerse the capacitor in solder solution at 260T5D for 10T1
sec. Let sit at room condition* for 24T2 hrs., then measure.
#Immersing speed: 25T2.5mm/s
Resistance
13 to Soldering
Heat
D.F.
I.R.
0.025 max.
CU0.01µF: More than 100MΩ • µF
CF0.01µF: More than 10,000MΩ
#Pretreatment
W 0
Perform a heat treatment at 150Y10 D for 60T5 min. and then
let sit for 24T2 hrs. at room condition.*
Dielectric
Strength
In accordance with item No.4
No marking defects
Within T7.5%
Appearance
Fix the capacitor to the supporting jig (glass epoxy board) shown
in Fig. 4.
Perform the 5 cycles according to the 4 heat treatments listed in
the following table.
Capacitance
Change
D.F.
I.R.
0.025 max.
Let sit for 24T2 hrs. at room condition,* then measure.
CU0.01µF: More than 100MΩ • µF
CF0.01µF: More than 10,000MΩ
Step
Temperature (D)
Min. Operating Temp.T3
Room Temp.
Time (min.)
30T3
2 to 3
1
2
3
4
Max. Operating Temp.T2
Room Temp.
30T3
2 to 3
Temperature
14
Cycle
#Pretreatment
W 0
Perform a heat treatment at 150Y10D for 60T5 min. and then
let sit for 24T2 hrs. at room condition.*
Dielectric
Strength
In accordance with item No.4
Solder resist
Cu
Glass Epoxy Board
Fig. 4
Appearance
No marking defects
Within T15%
0.05 max.
Capacitance
Change
Let the capacitor sit at 40T2D and relative humidity of 90 to 95%
W24
for 500Y 0 hrs.
Humidity
15 (Steady
State)
Remove and let sit for 24T2 hrs. at room condition,* then
measure.
D.F.
I.R.
CU0.01µF: More than 10MΩ • µF
CF0.01µF: More than 1,000MΩ
#Pretreatment
W 0
Perform a heat treatment at 150Y10 D for 60T5 min. and then
let sit for 24T2 hrs. at room condition.*
Dielectric
Strength
In accordance with item No.4
* "Room condition" Temperature: 15 to 35D, Relative humidity: 45 to 75%, Atmospheric pressure: 86 to 106kPa
Continued on the following page.
185
MURATA [ muRata ]
