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GRM2195C1H562JA01D 参数 Datasheet PDF下载

GRM2195C1H562JA01D图片预览
型号: GRM2195C1H562JA01D
PDF下载: 下载PDF文件 查看货源
内容描述: 片状独石陶瓷电容器 [Chip Monolithic Ceramic Capacitors]
分类和应用: 电容器陶瓷电容器
文件页数/大小: 221 页 / 4341 K
品牌: MURATA [ MURATA MANUFACTURING CO., LTD. ]
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• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
• This PDF catalog has only typical and Test Methods has only typical space for detailed specifications. Therefore, please approve our product specifications approve ourthe approval sheet for product specifications before ordering.
2. This Specifications specifications because there is no specifications because there is no space for detailed specifications. Therefore, please or transact product specifications or transact the approval sheet for product
0.
specifications before ordering.
10.12.20
LLL/LLA/LLM Series Specifications and Test Methods (1) and Test Methods (1)
LLL/LLR/LLA/LLM Series Specifications
No.
Item
Operating
Temperature
Range
Specifications
Test Method
1
R7, C7: –55 to +125°C
The rated voltage is defined as the maximum voltage that may
be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V
P-P
or V
O-P
,
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
Using calipers
No failure should be observed when 250% of the rated voltage
is applied between the terminations for 1 to 5 seconds,
provided the charge/discharge current is less than 50mA.
3
4
5
Appearance
Dimensions
Dielectric Strength
No defects or abnormalities
Within the specified dimension
No defects or abnormalities
CV0.047µF: More than 10,000MΩ
CG0.047µF: More than 500Ω · F
C: Normal Capacitance
Within the specified tolerance
W.V.: 25V min.; 0.025 max.
W.V.: 16V/10V max.; 0.035 max.
W.V.: 6.3V max.; 0.05 max.
6
7
Capacitance
8
Dissipation Factor
(D.F.)
The capacitance/D.F. should be measured at 25°C at the
frequency and voltage shown in the table.
Frequency: 1±0.1kHz
Voltage: 1±0.2Vrms
*For LLA185C70G474, the capacitance should be measured
unsing a voltage of 0.5±0.1Vrms.
The capacitance change should be measured after 5 min. at
each specified temperature stage.
Step
1
2
3
4
5
Temperature (°C)
25±2
–55±3
25±2
125±3
25±2
9
Capacitance
Temperature
Characteristics
Char.
R7
C7
Temp. Range
(°C)
–55 to +125
–55 to +125
Reference
Temp.
25°C
25°C
Cap.Change
Within
±15%
Within
±22%
10
Appearance
No defects or abnormalities
Capacitance
Within the specified tolerance
11
Vibration
Resistance
D.F.
W.V.: 25V min.; 0.025 max.
W.V.: 16V/10V max.; 0.035 max.
W.V.: 6.3V max.; 0.05 max.
Solder the capacitor to the test jig (glass epoxy board) in
the same manner and under the same conditions as (10). The
capacitor should be subjected to a simple harmonic motion
having a total amplitude of 1.5mm, the frequency being varied
uniformly between the approximate limits of 10 and 55Hz. The
frequency range, from 10 to 55Hz and return to 10Hz, should
be traversed in approximately 1 minute. This motion should be
applied for a period of 2 hours in each of 3 mutually
perpendicular directions (total of 6 hours).
Immerse the capacitor in a solution of ethanol (JIS-K-8101) and
rosin (JIS-K-5902) (25% rosin in weight proportion). Preheat at
80 to 120°C for 10 to 30 seconds. After preheating, immerse in
eutectic solder solution for 2±0.5 seconds at 230±5°C, or
Sn-3.0Ag-0.5Cu solder solution for 2±0.5 seconds at 245±5°C.
Preheat the capacitor at 120 to 150°C for 1 minute. Immerse
the capacitor in a eutectic solder or Sn-3.0Ag-0.5Cu solder
solution at 270±5°C for 10±0.5 seconds. Let sit at room
temperature for 24±2 hours, then measure.
• Initial measurement.
Perform a heat treatment at 150+0/–10°C for one hour and
then let sit for 24±2 hours at room temperature. Perform the
initial measurement.
Continued on the following page.
12
Solderability of
Termination
75% of the terminations are to be soldered evenly
and continuously.
Appearance
No marking defects
Resistance
13 to Soldering D.F.
Heat
I.R.
Dielectric
Strength
W.V.: 25V min.; 0.025 max.
W.V.: 16V/10V max.; 0.035 max.
W.V.: 6.3V max.; 0.05 max.
More than 10,000MΩ or 500Ω · F (whichever is smaller)
No failure
83
Product Information
Capacitance
Within
±7.5%
Change
For Bonding
GMD Series
Monolithic Microchip
GMA Series
Adhesive Strength
of Termination
No removal of the terminations or other defect should occur.
Solder the capacitor to the test jig (glass epoxy board) using a
eutectic solder. Then apply 10N* force in parallel with the test
jig for 10±1 sec. The soldering should be done either with an
iron or using the reflow method and should be conducted with
care so that the soldering is uniform and free of defects such as
heat shock.
*5N (LLL18 and LLA/LLM Series)
High Frequency
GQM Series
The ranges of capacitance change compared with the 25°C
value over the temperature ranges shown in the table should
be within the specified ranges.
• Initial measurement.
Perform a heat treatment at 150+0/-10°C for one hour and then
set for 24±2 hours at room temperature. Perform the initial
measurement.
High-Q
GJM Series
Low ESL
LLp Series
Insulation
Resistance
The insulation resistance should be measured with a DC voltage
not exceeding the rated voltage at 25°C and 75%RH max. and
within 2 minutes of charging.
Array
GNM Series
2
Rated Voltage
See the previous pages.
For General
GRM Series
When no "*" is added in PNs table, please refer to LLL/LLR/LLA/LLM Series Specifications and Test Methods (1).
When "*" is added in PNs table, please refer to LLL/LLR/LLA/LLM Series Specifications and Test Methods (2).