Specification
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
No
Item
Temperature
High Dielectric
Constant Type
Compensating Type
10 Vibration
Appearance No defects or abnormalities.
Capacitance Within the specified initial value.
Q or D.F. Within the specified initial value.
Solder the capacitor on the test substrate shown in Fig.3.
Kind of Vibration
Total amplitude
:
A simple harmonic motion
10Hz to 55Hz to 10Hz (1min)
: 1.5mm
This motion should be applied for a period of 2h in each 3 mutually
perpendicular directions(total of 6h).
11 Substrate
Bending test
Appearance No defects or abnormalities.
Capacitance Within +/-5% or +/-0.5pF
Solder the capacitor on the test substrate shown in Fig.1.
Pressurization method : Shown in Fig.2
Within +/-10%
Change
(Whichever is larger)
Flexureꢀ
ꢀꢀꢀ: 1mm
Holding Time
Soldering Method
:
5+/-1s
:
Reflow soldering
12 Solderability
Test Method
Flux
:
Solder bath method
Solution of rojin ethanol 25(wt)%
80℃ to 120℃ for 10s to 30s
Sn-3.0Ag-0.5Cu
95% of the terminations is to be soldered evenly and continuously.
Preheat
:
:
Solder
Solder Temp.
Immersion time
: 245+/-5℃
: 2+/-0.5s
13 Resistance to
Appearance No defects or abnormalities.
<GRM03 size min.>
Test Method
Solder
Soldering Heat Capacitance Within +/-2.5% or +/- 0.25pF Within +/-7.5%
:
Solder bath method
Sn-3.0Ag-0.5Cu
270+/-5℃
Change
Q or D.F.
I.R.
(Whichever is larger)
:
:
Solder Temp.
Immersion time
Exposure Time
Preheat
Within the specified initial value.
Within the specified initial value.
: 10+/-0.5s
:
24+/-2h
:
GRM31 size max.: 120℃ to 150℃ for 1 min
GRM32 size ꢀꢀ : 100℃ to 120℃ for 1 min
and 170℃ to 200℃ for 1 min
ꢀ
Voltage proof No defects.
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
<GRM02 size only>
Test Method
Solder
:
Reflow soldering (hot plate)
Sn-3.0Ag-0.5Cu
: 270+/-5℃
:
Solder Temp.
Reflow Time
Test Substrate
Exposure Time
Preheat
:
10+/-0.5s
:
Glass epoxy PCB
24+/-2h
:
:
120℃ to 150℃ for 1 min
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
14
Appearance No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Temperature
Capacitance Within +/-2.5% or+/- 0.25pF Within +/-7.5%
Sudden Change
Change
Q or D.F.
I.R.
(Whichever is larger)
Perform the five cycles according to the four heat treatments
shown in the following table.
Within the specified initial value.
Within the specified initial value.
Step
Temp.(C)
Min.Operating Temp.+0/-3
Room Temp.
Time (min)
30+/-3
2 to 3
1
2
3
4
Voltage proof No defects.
30+/-3
2 to 3
Max.Operating Temp.+3/-0
Room Temp
Exposure Time
: 24+/-2h
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
JEMCGS-0001U
3
MURATA [ muRata ]
