Item
Specification
Appearance No defects or abnormalities.
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Solder the capacitor on the test substrate shown in Fig.3.
No.
15 High
40+/-2℃
Temperature
High Humidity
(Steady)
Test Temperature :
Test Humidity :
Test Time :
Capacitance Within +/-7.5% or +/-0.75pF (Whichever is larger)
Change
90%RH to 95%RH
500+/-12h
Q or D.F.
Q≧200
Test Voltage :
Charge/Discharge Current :
Rated Voltage
50mA max.
I.R.
More than 500MΩ or 25Ω･F (Whichever is smaller)
Let sit for 24+/-2hours at room temperature, then measure.
Post-treatment :
16 Durability
Appearance No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Test Temperature :
Test Time :
Test Voltage :
Maximum Operating Temperature+/-3℃
1000+/-12h
200% of the rated voltage
50mA max.
Capacitance Within +/-3% or +/-0.3pF (Whichever is larger)
Change
Charge/Discharge Current :
Q or D.F.
Q≧350
I.R.
More than 1000MΩ or 50Ω･F (Whichever is smaller)
Let sit for 24+/-2hours at room temperature, then measure.
Post-treatment :
Table A Capacitance Change between at Reference Temp. and at each Temp. (%)
-55℃
-30℃
-10℃
Char.
7U
Max.
6.04
Max.
8.78
Min.
5.04
Min.
3.47
Max.
3.84
Min.
2.21
GRM1857U1H302JA44-01A
MURATA [ muRata ]
