■ Specifications and Test Methods
No Item
16 Durability
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384)
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-0.3pF
Q≧200+10C C:Nominal Capacitance(pF)
More than 1000MΩ
Mounting method
Test Temperature
Test Time
Solder the capacitor on the test substrate
Maximum Operating Temperature +/-3℃
1000+/-12h
I.R.
Test Voltage
200% of the rated voltage
Charge/discharge current 50mA max.
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
GRM0225C1C6R1CA03-01A
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