■ Specifications and Test Methods
No Item
Specification
Test Method(Ref. Standard:JIS C 5101, IEC60384）
Shown in Rated value.
The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V(peak to peak) or V(zero to peak),
whichever is larger, should be maintained within the rated voltage range.
1 Rated Voltage
No defects or abnormalities.
Shown in Dimension.
Visual inspection
2 Appearance
3 Dimension
Using Measuring instrument of dimension.
No defects or abnormalities.
Measurement Point
Test Voltage
Applied Time
Between the terminations
300% of the rated voltage
1s to 5s
4 Voltage proof
Charge/discharge current 50mA max.
Measurement Temperature
Measurement Point
Measurement Voltage
Charging Time
More than 10000MΩ
Room Temperature
Between the terminations
Rated Voltage
5 Insulation
Resistance(I.R.)
(Room Temperature)
1min
Charge/discharge current 50mA max.
Measurement Temperature
Shown in Rated value.
Room Temperature
6 Capacitance
Measurement Frequency 1.0+/-0.1MHz
Measurement Voltage
0.5 to 5.0Vrms
Measurement Temperature
Q≧400+20C C:Nominal Capacitance(pF)
Room Temperature
7 Q or Dissipation Factor
(D.F.)
Measurement Frequency 1.0+/-0.1MHz
Measurement Voltage 0.5 to 5.0Vrms
No bias
Nominal values of the temperature coefficientis is
The capacitance change should be measured after 5 min at each specified temp. stage.
Capacitance value as a reference is the value in "*" marked step.
8 Temperature
Characteristics of
Capacitance
shown in Rated value. But, the Capacitance Change
under Reference Temperature is shown inTable A.
Capacitance Drift: Within +/-0.2% or +/-0.05pF
(Whichever is larger.)
Capacitance Drift
The capacitance drift is calculated by dividing the differences between the maximum and minimum
measured values in the step 1,3 and 5 by the cap. value in step 3.
Less than 1.0Vrms (Refer to the individual data sheet)
Measurement Voltage
Temperature Step
No removal of the terminations or other defect should occur.
Mounting method
Applied Force
Solder the capacitor on the test substrate
1N
9 Adhesive Strength of
Termination
Holding Time
10+/-1s
Applied Direction
In parallel with the test substrate and vertical with the capacitor side
GRM0225C1C6R1CA03-01A
2
MURATA [ muRata ]
