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GCQ1555C1H6R6WB01# 参数 Datasheet PDF下载

GCQ1555C1H6R6WB01#图片预览
型号: GCQ1555C1H6R6WB01#
PDF下载: 下载PDF文件 查看货源
内容描述: [汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C]]
分类和应用: 医疗医疗器械
文件页数/大小: 29 页 / 1730 K
品牌: MURATA [ muRata ]
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Specifications and Test Methods  
No Item  
15 Solderability (a)  
Specification  
Test MethodRef. Standard:AEC-Q200)  
Perform a heat treatment at 155°C for 4hours.  
95% of the terminations is to be soldered evenly and continuously.  
Pre-treatment  
Flux  
Solution of rosin ethanol 25(mass)%  
Sn-3.0Ag-0.5Cu(Lead Free Solder)  
Sn-3.0Ag-0.5Cu solder solution at 245+/-5 ℃  
5+0/-0.5s  
Kind of Solder  
Solder Temperature  
Immersion time  
Immersion and emersion rate  
25+/-5mm/s  
Measurement Temperature  
Shown in Rated value.  
25℃  
16 Capacitance  
Measurement Frequency 1.0+/-0.1MHz  
Measurement Voltage  
0.5 to 5.0Vrms  
Measurement Temperature  
Q400+20C C:Nominal Capacitance(pF)  
More than 10000MΩ  
25℃  
17 Q or Dissipation Factor  
(D.F.)  
Measurement Frequency 1.0+/-0.1MHz  
Measurement Voltage  
0.5 to 5.0Vrms  
Measurement Temperature  
Measurement Voltage  
Charging Time  
25℃  
Rated Voltage  
1min  
18 Insulation  
Resistance(I.R.)  
(Room Temperature)  
Charge/discharge current 50mA max.  
Measurement Temperature  
Measurement Voltage  
Charging Time  
More than 1000MΩ  
125℃  
Rated Voltage  
1min  
19 Insulation  
Resistance(I.R.)  
(High Temperature)  
Charge/discharge current 50mA max.  
No defects or abnormalities.  
Test Voltage  
Applied Time  
Charge/discharge current 50mA max.  
250% of the rated voltage  
1s to 5s  
20 Voltage proof  
21 Board Flex  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-0.5pF  
Within the specified initial value.  
Within the specified initial value.  
Mounting method  
Pressurization Method  
Flexure  
Reflow solder the capacitor on the test substrate  
Shown in Fig.2  
2mm  
I.R.(Room Temp.)  
Holding Time  
60s  
Appearance  
Capacitance  
Q or D.F.  
No defects or abnormalities.  
Mounting method  
Applied Force  
Holding Time  
Solder the capacitor on the test substrate  
2N  
60s  
22 Terminal Strength  
23 Beam Load Test  
Within the specified initial value.  
Within the specified initial value.  
Within the specified initial value.  
I.R.(Room Temp.)  
Speed supplied the Stress Load  
Destruction Value: More than 8N  
0.5mm/s  
Placement diagram  
GCQ1555C1H6R6WB01-01A  
4
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