■ Specifications and Test Methods
No Item
Specification
Test Method（Ref. Standard:AEC-Q200）
-
-
1 Pre-and Post-Stress
Electrical Test
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-10%
DF≦0.03
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
2 High Temperature
Exposure (Storage)
I.R.(Room Temp.)
More than 500Ω・F
Test Temperature
Test Time
150+/-3℃
1000+/-12h
Post-treatment
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
Capacitance Change
Q or D.F.
No defects or abnormalities.
Within +/-10%
DF≦0.03
Mounting method
Pre-treatment
Solder the capacitor on the test substrate
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours
at room temperature, then measure.
1000cycles
3 Temperature Cycling
I.R.(Room Temp.)
More than 500Ω・F
Cycles
Temperature Cycling
Post-treatment
Per EIA-469
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.
Appearance
No defects or abnormalities.
4 Destructive Physical
Analysis
GCM21BR71H184JA37-01A
2
MURATA [ muRata ]
