■AEC-Q200 Murata Standard Specification and Test Methods
Specification.
No
AEC-Q200 Test Item
AEC-Q200 Test Method
High Dielectric Type
Temperature
Compensating Type
17 Beam Load Test
Destruction value should be exceed following one.
< Chip L dimension : 2.5mm max. >
Place the capacitor in the beam load fixture as Fig 2.
Apply a force.
< Chip Length : 2.5mm max. >
Chip thickness > 0.5mm rank : 20N
Chip thickness ≦0.5mm rank : 8N
< Chip L dimension : 3.2mm mim. >
Iron Board
Chip thickness < 1.25mm rank : 15N
Chip thickness ≧1.25mm rank : 54.5N
< Chip Length : 3.2mm min. >
L
0.6L
Fig.2
Speed supplied the Stress Load : 0.5mm / sec.
18 Capacitance
Temperature
Capacitance
Change
Within the specified tolerance.
(Table A)
R7 : Within ±15%
(-55℃ to +125℃)
L8 : Within ±15%
(-55℃ to +125℃)
ꢀꢀꢀWithin +15/-40%
(+125℃ to +150℃)
R9 : Within ±15%
(-55℃ to +150℃)
The capacitance change should be measured after 5 min. at
each specified temperature stage.
Characteristics
(1)Temperature Compensating Type
The temperature coefficient is determined using the capacitance
measured in step 3 as a reference. When cycling the temperature
sequentially from step1 through 5 (Δ C: +25℃ to +125℃,
5G:+25℃ to +150℃ other temp. coifficient.:+25℃ to +85℃) the
capacitance should be within the specified tolerance for the
temperature coefficient and capacitance change as Table A-1. The
capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the step
1,3 and 5 by the cap value in step 3.
Temperature
Coefficient
Within the specified tolerance.
(Table A)
Step
1
Temperature.(C)
25±2
2
3
4
5
-55±3(for ΔC to R7)
25±2
125±3（for ΔC/R7）, 150±3（for 5G/R9/L8）
25±2
Within ±0.2% or ±0.05 pF
Capacitance
Drift
(Whichever is larger.)
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the above 25℃
value over the temperature ranges shown in the table should be
within the specified ranges.
Initial measurement for high dielectric constant type.
Perform a heat treatment at 150+0/-10℃ for one hour
and then set for 24±2 hours at room temperature.
Perform the initial measurement.
Table A
Char.
Capacitance Change from 25C (%)
-30
Nominal Values
(ppm/C)
-55
-10
Max.
0.58
Min.
-0.24
Max.
0.40
Min.
-0.17
Max.
0.25
Min.
-0.11
5C/5G
0± 30
Note1: Nominalvaluesdenotethetemperaturecoefficientwithinarangeof 25Cto125C(forC)/ 150C(for5G).
JEMCGS-01499C
5
MURATA [ muRata ]
