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GCG188R71E184KA12# 参数 Datasheet PDF下载

GCG188R71E184KA12#图片预览
型号: GCG188R71E184KA12#
PDF下载: 下载PDF文件 查看货源
内容描述: [汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C]]
分类和应用: 医疗医疗器械
文件页数/大小: 17 页 / 668 K
品牌: MURATA [ muRata ]
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AEC-Q200 Murata Standard Specification and Test Methods  
Specification.  
No  
AEC-Q200 Test Item  
AEC-Q200 Test Method  
High Dielectric Type  
Temperature  
Compensating Type  
14 ESD  
Appearance  
Capacitance  
Change  
No marking defects  
Per AEC-Q200-002  
Within the specified tolerance  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V :0.035 max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
I.R.  
More than 10,000MΩ or 500ΩF  
(Whichever is smaller)  
15 Electrical Appearance  
Chatacteri- Capacitance  
No defects or abnormalities  
Within the specified tolerance  
Visual inspection.  
The capacitance/Q/D.F. should be measured at 25at the  
frequency and voltage shown in the table.  
zation  
Change  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V : 0.035 max.  
R9 : 0.075max.  
Char.  
ΔC,5G  
(more than 1000pF)  
R7,R9,L8(C10μF)  
ΔC,5G  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
(1000 pF and below)  
Item  
Frequency  
Voltage  
1±0.1MHz  
1±0.1kHz  
0.5 to 5Vrms  
1±0.2Vrms  
The insulation resistance should be measured with a DC voltage not  
exceeding the rated voltage at 25and 125(for Δ C/R7)/ 150℃  
for 5G/L8/R9within 2 minutes of charging.  
I.R.25℃  
More than 100,000MΩ or 1000ΩF More than 10,000MΩ or 500ΩF  
(Whichever is smaller)  
(Whichever is smaller)  
I.R.125℃  
I.R.150℃  
More than 10,000MΩ or 100ΩF  
More than 1,000MΩ or 10ΩF  
(Whichever is smaller)  
(Whichever is smaller)  
More than 10,000MΩ or 100ΩF  
More than 1,000MΩ or 1ΩF  
(Whichever is smaller)  
(Whichever is smaller)  
No failure should be observed when 250% of the rated voltage is  
applied between the terminations for 1 to 5 seconds, provided the  
charge/ discharge current is less than 50mA.  
Dielectric  
Strength  
No failure  
16 Terminal  
Strength  
Appearance  
No marking defects  
Mount the capacitor on the test jig in Fig.1 using a conductive glue  
(HEREAUS"PC3000").  
Capacitance  
Change  
Within specified tolerance  
The conductive glue is hardened at 140for 30minites.  
Then apply *shear tension in parallel with the test jig for 60sec.  
Q/D.F.  
30pFmin. : Q1000  
R7/L8 : W.V.: 25Vmin.: 0.025 max.  
W.V.: 16V: 0.035max.  
R9 : 0.075max.  
30pFmax.: Q 400+20C  
C: Nominal Capacitance(pF)  
*Show in the table 1  
Alumina  
Ag Pd electrode  
c
I.R.  
More than 10,000MΩ or 500Ω F  
(Whichever is smaller)  
b
a
Type  
GCG15  
GCG18  
GCG21  
GCG31  
GCG32  
Share Tension  
2.0N  
2.7N  
4.9N  
6.9N  
12.6N  
Type  
GCG15  
GCG18  
GCG21  
GCG31  
GCG32  
a
b
c
0.4  
1.0  
1.2  
2.2  
2.2  
1.5  
3.0  
4.0  
5.0  
5.0  
0.5  
1.2  
1.65  
Table.1  
2.0  
2.9  
Fig.1  
in mm)  
JEMCGS-01499C  
4
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