ELECTRICAL SPECIFICATIONS
BBF2805S
BBF2805S H/E
BBF2805S
Group A
Subgroup
Units
Test Conditions 1
Parameter
Typ.
Max.
Min.
Typ.
Max.
Min.
VDC
VDC
mA
mA
mVrms
mVrms
mArms
mArms
mV
mV
mV
mV
%
5.05
5.15
1
2,3
1
5.00
5.05
5.10
5.20
4000
4000
50
4.95
Output Voltage
-
-
4.90
-
-
-
4000
400
-
400
2
16V≤VIN≤40V
BW=10KHz to 2MHz
BW=10KHz to 2MHz
VIN=16V to 40V
Output Current
-
-
60
-
2,3
1
400
-
-
20
-
20
-
Output Voltage Ripple
Input Current Ripple 2
Line Regulation
-
2,3
1
-
-
60
-
20
60
-
-
20
50
-
-
2,3
1
-
-
60
-
5
50
-
-
5
25
-
-
2,3
1
-
-
50
-
2
50
-
-
2
25
-
IOUT=0.4A to 4.0A
Load Regulation
Efficiency
-
2,3
1
-
-
50
-
72
-
65
72
-
65
%
-
-
2,3
4
61
-
-
-
mV
mV
µS
IOUT=2A to/from 4A
Transition TIme=30µS
IOUT=2A to/from 4A
Transition TIme=30µS
VIN=16V to/from 40V
Transition Time=30µS
VIN=16V to/from 40V
Transition Time=30µS
700
1200
-
-
700
1000
1500
200
300
800
1100
200
300
400
600
60
-
Step Load Response
Step Load Recovery
Step Line Response
Step Line Recovery
Start Up Overshoot
2
-
5,6
4
-
-
-
100
220
-
-
100
-
2
µS
-
5,6
4
-
-
-
mV
mV
µS
500
900
-
-
500
-
2
-
5,6
4
-
-
-
80
220
-
-
80
-
2
µS
-
5,6
4
-
-
-
mV
mV
mS
mS
µS
0
400
-
-
0
-
IOUT=4.0A
IOUT=4.0A
-
5,6
4
-
-
-
30
60
100
500
-
-
30
-
2
Start Up Delay
-
5,6
4
-
-
100
500
550
60
-
120
-
120
-
2
Shutdown Delay
µS
-
5,6
-
-
-
-
mS
V
2
2
20
60
40
40
-
Shutdown Recovery
Input Voltage Range
-
16
-
20
-
16
-
POUT=20W MAX.
-
1,2,3
1
-
40
mA
mA
mA
µF
35
35
40
Enabled, IOUT=0mA
Quiescent Current
-
2,3
1,2,3
1,2,3
1
-
-
50
-
Disabled IOUT=0mA
No Effect on DC Performance
1.25
2.5
300
-
-
1.25
2.5
300
-
-
2
Capacitive Load
Isolation
-
-
-
-
-
-
MΩ
A
Input to output or any pin to case @ 500V
100
4.0
475
10
100
4.0
475
10
Short Circuit Current Limit
Switching Frequency
7
6.0
500
-
7.0
525
-
1
6.0
500
-
7.0
525
-
KHz
%
4
VOUT Adjustment Range
RPOT=50KΩ
1
NOTES:
1 +VIN = 28V, IOUT = 4.0A, TA=TC=25°C unless otherwise specified.
2 Guaranteed by design but not tested. Typical parameters are representative of actual device performance but are for reference only.
3 Industrial grade and "E" suffix devices shall be tested to subgroups 1 and 4 unless otherwise specified.
4 Military grade devices ("H" suffix) shall be 100% tested to subgroups 1, 2, 3 and 4.
5 Subgroups 5 and 6 testing available upon request.
6 Subgroup 1, 4 TA=TC=+25°C
2, 5 TA=TC=+125°C
3, 6 TA=TC= -55°C
7 Device has internal shutdown feature that pulses the output with a low duty cycle during faults.
4
Rev. E 12/04