A/D CONVERTER ELECTRICAL CHARACTERISTICS
(Full Temperature and Voltage Ranges per Operation Ranges Table)
Guaranteed
Limit
Characteristic
Resolution
Definition and Test Conditions
Unit
Bits
Number of bits resolved by the A/D converter
10
± 1
± 1
Maximum Nonlinearity
Maximum Zero Error
Maximum difference between an ideal and an actual ADC transfer function
LSB
LSB
Difference between the maximum input voltage of an ideal and an actual
ADC for zero output code
Maximum Full-Scale Error
Difference between the minimum input voltage of an ideal and an actual
ADC for full-scale output code
± 1
LSB
Maximum Total Unadjusted Error
Maximum Quantization Error
Absolute Accuracy
Maximum sum of nonlinearity, zero error, and full-scale error
Uncertainty due to converter resolution
± 1
LSB
LSB
LSB
± 1/2
Difference between the actual input voltage and the full-scale weighted
equivalent of the binary output code, all error sources included
± 1-1/2
Maximum Conversion Time
Data Transfer Time
Total time to perform a single analog-to-digital conversion
44
µs
Total time to transfer digital serial data into and out of the device
10 to 16
SCLK
cycles
Sample Acquisition Time
Minimum Total Cycle Time
Maximum Sample Rate
Analog input acquisition time window
6
SCLK
cycles
Total time to transfer serial data, sample the analog input, and perform the
conversion; SCLK = 2.1 MHz
49
µs
Rate at which analog inputs may be sampled; SCLK = 2.1 MHz
20.4
ks/s
MC145053
3
MOTOROLA WIRELESS SEMICONDUCTOR
SOLUTIONS DEVICE DATA
MOTOROLA [ MOTOROLA ]
