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V53C816H40 参数 Datasheet PDF下载

V53C816H40图片预览
型号: V53C816H40
PDF下载: 下载PDF文件 查看货源
内容描述: 512K ×16快速页面模式的CMOS动态RAM [512K X 16 FAST PAGE MODE CMOS DYNAMIC RAM]
分类和应用:
文件页数/大小: 18 页 / 215 K
品牌: MOSEL [ MOSEL VITELIC, CORP ]
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MO SEL VITELIC  
V53C816H  
Functional Description  
Fast Page Mode Operation  
The V53C816H is a CMOS dynamic RAM opti-  
mized for high data bandwidth, low power applica-  
tions. It is functionally similar to a traditional  
dynamic RAM. The V53C816H reads and writes  
data by multiplexing an 19-bit address into a 10-bit  
row and a 9-bit column address. The row address is  
latched by the Row Address Strobe (RAS). The col-  
umn address “flows through” an internal address  
buffer and is latched by the Column Address Strobe  
(CAS). Because access time is primarily dependent  
on a valid column address rather than the precise  
time that the CAS edge occurs, the delay time from  
RAS to CAS has little effect on the access time.  
Fast Page Mode operation permits all 512 col-  
umns within a selected row of the device to be ran-  
domly accessed at a high data rate. Maintaining  
RAS low while performing successive CAS cycles  
retains the row address internally and eliminates the  
need to reapply it for each cycle. The column ad-  
dress buffer acts as a transparent or flow-through  
latch while CAS is high. Thus, access begins from  
the occurrence of a valid column address rather  
than from the falling edge of CAS, eliminating t  
ASC  
and t from the critical timing path. CAS latches the  
T
address into the column address buffer and acts as  
an output enable. During Fast Page Mode opera-  
tion, Read, Write, Read-Modify-Write or Read-  
Write-Read cycles are possible at random address-  
es within a row. Following the initial entry cycle into  
Memory Cycle  
A memory cycle is initiated by bringing RAS low.  
Any memory cycle, once initiated, must not be end-  
Fast Page Mode, access is t  
or t  
controlled.  
CAA  
CAP  
ed or aborted before the minimum t  
pired. This ensures proper device operation and  
data integrity. A new cycle must not be initiated until  
time has ex-  
If the column address is valid prior to the rising edge  
of CAS, the access time is referenced to the CAS  
RAS  
rising edge and is specified by t  
. If the column  
CAP  
the minimum precharge time t /t has elapsed.  
address is valid after the rising CAS edge, access  
is timed from the occurrence of a valid address and  
RP CP  
is specified by t  
. In both cases, the falling edge  
Read Cycle  
CAA  
A Read cycle is performed by holding the Write  
Enable (WE) signal High during a RAS/CAS opera-  
tion. The column address must be held for a mini-  
of CAS latches the address and enables the output.  
Fast Page Mode provides a sustained data rate of  
43 MHz for applications that require high data rates  
such as bit-mapped graphics or high-speed signal  
processing. The following equation can be used to  
calculate the maximum data rate:  
mum specified by t . Data Out becomes valid only  
AR  
when t  
, t  
, t  
and t  
are all satisifed. As  
OAC RAC CAA  
CAC  
a result, the access time is dependent on the timing  
relationships between these parameters. For exam-  
512  
ple, the access time is limited by t  
when t  
,
CAA  
RAC  
Data Rate = ----------------------------------------  
t
and t  
are all satisfied.  
t
+ 511 × t  
CAC  
OAC  
RC PC  
Write Cycle  
A Write Cycle is performed by taking WE and  
CAS low during a RAS operation. The column ad-  
dress is latched by CAS. The Write Cycle can be  
WE controlled or CAS controlled depending on  
whether WE or CAS falls later. Consequently, the  
input data must be valid at or before the falling edge  
of WE or CAS, whichever occurs last. In the CAS-  
controlled Write Cycle, when the leading edge of  
WE occurs prior to the CAS low transition, the I/O  
data pins will be in the High-Z state at the beginning  
of the Write function. Ending the Write with RAS or  
CAS will maintain the output in the High-Z state.  
In the WE controlled Write Cycle, OE must be in  
Data Output Operation  
The V53C816H Input/Output is controlled by OE,  
CAS, WE and RAS. A RAS low transition enables  
the transfer of data to and from the selected row ad-  
dress in the Memory Array. A RAS high transition  
disables data transfer and latches the output data if  
the output is enabled. After a memory cycle is initi-  
ated with a RAS low transition, a CAS low transition  
or CAS low level enables the internal I/O path. A  
CAS high transition or a CAS high level disables the  
I/O path and the output driver if it is enabled. A CAS  
low transition while RAS is high has no effect on the  
I/O data path or on the output drivers. The output  
drivers, when otherwise enabled, can be disabled  
by holding OE high. The OE signal has no effect on  
the high state and t  
must be satisfied.  
OED  
V53C816H Rev. 1.3 February 1999  
15  
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