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V53C8129H35 参数 Datasheet PDF下载

V53C8129H35图片预览
型号: V53C8129H35
PDF下载: 下载PDF文件 查看货源
内容描述: 超高性能, 128K X 8EDO页模式的CMOS动态RAM [ULTRA-HIGH PERFORMANCE, 128K X 8EDO PAGE MODE CMOS DYNAMIC RAM]
分类和应用:
文件页数/大小: 18 页 / 200 K
品牌: MOSEL [ MOSEL VITELIC, CORP ]
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MOSEL VITELIC  
V53C8129H  
Functional Description  
Refresh Cycle  
The V53C8129H is a CMOS dynamic RAM opti-  
mized for high data bandwidth, low power applica-  
tions. It is functionally similar to a traditional  
dynamic RAM. The V53C8129H reads and writes  
data by multiplexing an 17-bit address into a 8-bit  
row and an 9-bit column address. The row address  
is latched by the Row Address Strobe (RAS). The  
column address “flows through” an internal address  
buffer and is latched by the Column Address Strobe  
(CAS). Because access time is primarily dependent  
on a valid column address rather than the precise  
time that the CAS edge occurs, the delay time from  
RAS to CAS has little effect on the access time.  
To retain data, 512 Refresh Cycles are required  
in each 8 ms period. There are two ways to refresh  
the memory:  
1. By clocking each of the 512 row addresses (A  
0
through A ) with RAS at least once every 8 ms.  
8
Any Read, Write, Read-Modify-Write or RAS-  
only cycle refreshes the addressed row.  
2. Using a CAS-before-RAS Refresh Cycle. If CAS  
makes a transition from low to high to low after  
the previous cycle and before RAS falls, CAS-  
before-RAS  
refresh  
is  
activated.  
The  
V53C8129H uses the output of an internal 9-bit  
counter as the source of row addresses and ig-  
nore external address inputs.  
Memory Cycle  
A memory cycle is initiated by bringing RAS low.  
Any memory cycle, once initiated, must not be end-  
CAS-before-RAS is a “refresh-only” mode and no  
data access or device selection is allowed. Thus,  
the output remains in the High-Z state during the cy-  
cle. A CAS-before-RAS counter test mode is provid-  
ed to ensure reliable operation of the internal  
refresh counter.  
ed or aborted before the minimum t  
time has ex-  
RAS  
pired. This ensures proper device operation and  
data integrity. A new cycle must not be initiated until  
the minimum precharge time t /t has elapsed.  
RP CP  
Read Cycle  
A Read cycle is performed by holding the Write  
Enable (WE) signal High during a RAS/CAS opera-  
tion. The column address must be held for a mini-  
Extended Data Out Page Mode  
The V53C8129H offers fast access within a row.  
Unlike ordinary fast page mode DRAM, the  
V53C8129H output remains active and valid even  
after CAS goes high and it will stay valid for 5ns af-  
ter CAS changes low. The feature allows the  
V53C8129H to CAS cycle faster than ordinary page  
mode DRAM since the cycle time be short as data  
access time.  
mum specified by t . Data Out becomes valid only  
AR  
when t  
, t  
, t  
and t  
are all satisifed. As  
OAC RAC CAA  
CAC  
a result, the access time is dependent on the timing  
relationships between these parameters. For exam-  
ple, the access time is limited by t  
when t  
,
CAA  
RAC  
t
and t  
are all satisfied.  
CAC  
OAC  
The outputs are disabled at the tHZ time after  
RAS and CAS are high. The tHZ time is referenced  
from rising edge of RAS or CAS whichever occurs  
last. In addition, high on OE input and activation of  
the write-cycle will also disable the outputs.  
The following equation can be used to calculate  
the maximum data rate:  
Write Cycle  
A Write Cycle is performed by taking WE and  
CAS low during a RAS operation. The column ad-  
dress is latched by CAS. The Write Cycle can be  
WE controlled or CAS controlled depending on  
whether WE or CAS falls later. Consequently, the  
input data must be valid at or before the falling edge  
of WE or CAS, whichever occurs last. In the CAS-  
controlled Write Cycle, when the leading edge of  
WE occurs prior to the CAS low transition, the I/O  
data pins will be in the High-Z state at the beginning  
of the Write function. Ending the Write with RAS or  
CAS will maintain the output in the High-Z state.  
In the WE controlled Write Cycle, OE must be in  
256  
Data Rate = ----------------------------------------  
t
+ 255 × t  
RC  
PC  
the high state and t  
must be satisfied.  
OED  
V53C8129H Rev. 1.3 July 1997  
14  
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