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V53C16258HT40 参数 Datasheet PDF下载

V53C16258HT40图片预览
型号: V53C16258HT40
PDF下载: 下载PDF文件 查看货源
内容描述: 高性能256K ×16 EDO页模式的CMOS动态RAM可选自刷新 [HIGH PERFORMANCE 256K X 16 EDO PAGE MODE CMOS DYNAMIC RAM OPTIONAL SELF REFRESH]
分类和应用: 内存集成电路光电二极管动态存储器
文件页数/大小: 20 页 / 560 K
品牌: MOSEL [ MOSEL VITELIC, CORP ]
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MO SEL VITELIC  
V53C16258H  
The Self Refresh mode is terminated by returning  
Power-On  
the RAS clock to a high level for a specified (t  
)
After application of the V  
supply, an initial  
RPS  
CC  
minimum time. After termination of the Self Refresh  
cycle normal accesses to the device may be initiat-  
ed immediately, providing that subsequent refresh  
cycles utilize the CAS before RAS (CBR) mode of  
operation.  
pause of 200 µs is required followed by a minimum  
of 8 initialization cycles (any combination of cycles  
containing a RAS clock). Eight initialization cycles  
are required after extended periods of bias without  
clocks (greater than the Refresh Interval).  
During Power-On, the V current requirement of  
CC  
the V53C16258H is dependent on the input levels of  
RAS and CAS. If RAS is low during Power-On, the  
Data Output Operation  
The V53C16258H Input/Output is controlled by  
OE, CAS, WE and RAS. A RAS low transition  
enables the transfer of data to and from the selected  
row address in the Memory Array. A RAS high  
transition disables data transfer and latches the  
output data if the output is enabled. After a memory  
cycle is initiated with a RAS low transition, a CAS  
low transition or CAS low level enables the internal  
I/O path. A CAS high transition or a CAS high level  
disables the I/O path and the output driver if it is  
enabled. A CAS low transition while RAS is high has  
no effect on the I/O data path or on the output  
drivers. The output drivers, when otherwise  
enabled, can be disabled by holding OE high. The  
OE signal has no effect on any data stored in the  
output latches. A WE low level can also disable the  
output drivers when CAS is low. During a Write  
cycle, if WE goes low at a time in relationship to  
CAS that would normally cause the outputs to be  
active, it is necessary to use OE to disable the  
output drivers prior to the WE low transition to allow  
device will go into an active cycle and I will exhibit  
CC  
current transients. It is recommended that RAS and  
CAS track with V or be held at a valid V during  
CC  
IH  
Power-On to avoid current surges.  
Table 1. V53C16258H Data Output  
Operation for Various Cycle Types  
Cycle Type  
I/O State  
Read Cycles  
Data from Addressed  
Memory Cell  
CAS-Controlled Write  
Cycle (Early Write)  
High-Z  
WE-Controlled Write  
Cycle (Late Write)  
OE Controlled. High  
OE = High-Z I/Os  
Read-Modify-Write  
Cycles  
Data from Addressed  
Memory Cell  
EDO Read Cycle  
Data from Addressed  
Memory Cell  
Data In Setup Time (t ) to be satisfied.  
EDO Write Cycle  
(Early Write)  
High-Z  
DS  
EDO Read-Modify-  
Write Cycle  
Data from Addressed  
Memory Cell  
RAS-only Refresh  
High-Z  
CAS-before-RAS  
Refresh Cycle  
Data remains as in  
previous cycle  
CAS-only Cycles  
High-Z  
V53C16258H Rev. 3.8 November 1999  
17  
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