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MSM8512VM-85 参数 Datasheet PDF下载

MSM8512VM-85图片预览
型号: MSM8512VM-85
PDF下载: 下载PDF文件 查看货源
内容描述: [Standard SRAM, 512KX8, 85ns, CMOS, CDXA32, VIL-32]
分类和应用: 静态存储器
文件页数/大小: 8 页 / 115 K
品牌: MOSAIC [ MOSAIC ]
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MSM8512 - 70/85/10
ISSUE 4.3 : January 1999
32 pin J Leaded LCC (JLCC)
11.70 (0.460)
11.30 (0.445)
1.90 (0.075)
1.65 (0.065)
1.27 (0.050) typ
0.71 (0.028) typ
No. 1 Index
18.03 (0.710)
17.65 (0.695)
0.43 (0.017)
typ
17.53 (0.690)
16.58 (0.650)
10.45 (0.410)
9.95 (0.390)
4.07 (0.160)
3.56 (0.140)
7.87 (0.310)
7.37 (0.290)
All dimensions in mm (inches).
Military Screening Procedure
Screening Flow
for high reliability product in accordance with MIL-STD-883 method 5004 is shown below.
MB COMPONENT SCREENING FLOW
SCREEN
Visual and Mechanical
Internal visual
Temperature cycle
Constant acceleration
Pre-Burn-in electrical
Burn-in
Final Electrical Tests
Static (dc)
Functional
Switching (ac)
2010 Condition B or manufacturers equivalent
1010 Condition C (10 Cycles,-65
°
C to +150
°
C)
2001 Condition E (Y, only) (30,000g)
Per applicable device specifications at T
A
=+25
°
C
Method 1015,Condition D,T
A
=+125
°
C,160hrs min
Per applicable Device Specification
a) @ T
A
=+25
°
C and power supply extremes
b) @ temperature and power supply extremes
a) @ T
A
=+25
°
C and power supply extremes
b) @ temperature and power supply extremes
a) @ T
A
=+25
°
C and power supply extremes
b) @ temperature and power supply extremes
Calculated at post-burn-in at T
A
=+25
°
C
1014
Condition A
Condition C
2009 Per vendor or customer specification
100%
100%
100%
100%
100%
100%
100%
100%
100%
5%
100%
100%
100%
100%
100%
TEST METHOD
LEVEL
Percent Defective allowable (PDA)
Hermeticity
Fine
Gross
External Visual
7