MT8940 ISO-CMOS
AC Electrical Characteristics† - Uncommitted NAND Gate
Voltages are with respect to ground (V ) unless otherwise stated.
SS
‡
Characteristics
Sym
Min
Typ
Max
Units
Test Conditions
1
2
Propagation delay (LOW to
HIGH), input Ai or Bi to output
t
t
25
40
ns
Test load circuit 1 (Fig. 17)
PLH
Propagation delay (HIGH to
LOW), input Ai or Bi to output
20
40
ns
Test load circuit 1 (Fig. 17)
PHL
† Timing is over recommended temperature & power supply voltages.
‡ Typical figures are at 25°C and are for design aid only: not guaranteed and not subject to production testing.
V
DD
V
DD
R =1kΩ
L
Test
point
A
B
R =1kΩ
From
L
From
From
Test
point
Test
point
output
output
output
under test
S
under test
under test
1
V
SS
C =50pF
L
C =50pF
C =50pF
Note: S is in position A
L
L
1
when measuring t
PLZ
and t and in position B
PZ
when measuring t
PZH
and
PHZ
t
Test load circuit- 1
Test load circuit- 2
Test load circuit- 3
Figure 17 - Test Load Circuits
3-42
MITEL [ MITEL NETWORKS CORPORATION ]
