HAL54x
DATA SHEET
μA
dBμA
HAL54x
HAL54x
4
10
30
V
= 12 V
DD
3
10
T = 25 °C
A
Quasi-Peak-
Measurement
20
10
2
10
10
I
I
OH
DD
max.spurious
signals
1
T =150 °C
A
0
10
10
T =100 °C
A
–1
0
–2
10
T =25 °C
A
–10
–20
–30
–3
10
10
10
–4
T = –40 °C
A
–5
–6
10
15
20
25
30
35
0.01
0.10
1.00 10.00 100.00 1000.00
10 100 1000
V
1
MHz
V
OH
f
Fig. 3–15: Typ. output high current
Fig. 3–17: Typ. spectrum of supply current
versus output voltage
μA
dBμV
HAL54x
HAL54x
2
80
10
V = 12 V
P
T = 25 °C
A
70
60
50
40
30
20
10
0
1
Quasi-Peak-
Measurement
test circuit 2
10
I
V
DD
OH
V
OH
= 24 V
0
10
–1
max.spurious
signals
10
V
OH
= 3.8 V
–2
10
10
10
10
–3
–4
–5
–50
0
50
100
150
200°C
0.01
0.10
1.00 10.00 100.00 1000.00
10 100 1000
1
MHz
T
A
f
Fig. 3–16: Typical output leakage current
Fig. 3–18: Typ. spectrum of supply voltage
versus ambient temperature
18
Feb. 12, 2009; DSH000023_003EN
Micronas