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N25Q512A83GSF40G 参数 Datasheet PDF下载

N25Q512A83GSF40G图片预览
型号: N25Q512A83GSF40G
PDF下载: 下载PDF文件 查看货源
内容描述: 美光的串行NOR闪存3V ,多个I / O, 4KB扇区擦除N25Q512A [Micron Serial NOR Flash Memory 3V, Multiple I/O, 4KB Sector Erase N25Q512A]
分类和应用: 闪存
文件页数/大小: 91 页 / 1214 K
品牌: MICRON [ MICRON TECHNOLOGY ]
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512Mb, Multiple I/O Serial Flash Memory  
Nonvolatile and Volatile Registers  
Extended Address Register  
In the case of 3-byte addressability mode, the device includes an extended address reg-  
ister that provides a fourth address byte A[31:24], enabling access to memory beyond  
128Mb. The extended address register bits [1:0] are used to select one of the four 128Mb  
segments of the memory array.  
Figure 8: Upper and Lower Memory Array Segments  
03FFFFFFh  
03000000h  
A[25:24] = 11  
A[25:24] = 10  
02FFFFFFh  
02000000h  
01FFFFFFh  
01000000h  
A[25:24] = 01  
A[25:24] = 00  
00FFFFFFh  
00000000h  
The PROGRAM and ERASE operations act upon the 128Mb segment selected in the ex-  
tended address register.  
The READ operation begins reading in the selected 128Mb segment. It is bound by the  
256Mb (die segment) to which the 128Mb segment belongs. In a continuos read, when  
the last byte of the die segment selected is read, the next byte output is the first byte of  
the same die segment; therefore, a download of the whole array is not possible with one  
READ operation. The value of the extended address register does not change when a  
READ operation crosses the selected 128Mb boundary.  
PDF: 09005aef84752721  
n25q_512mb_1ce_3V_65nm.pdf - Rev. O 05/13 EN  
Micron Technology, Inc. reserves the right to change products or specifications without notice.  
23  
© 2011 Micron Technology, Inc. All rights reserved.  
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