Micron M25P40 Serial Flash Embedded Memory
AC Characteristics
AC Characteristics
In the following AC specifications, output HIGH-Z is defined as the point where data
out is no longer driven; however, this is not applicable to the M25PX64 device.
Table 16: Device Grade and AC Table Correlation
150nm
f[min]
110nm
f[min]
75MHz
Device Grade
VCC[min]
AC Table
VCC[min]
AC Table
Grade 3
2.7V
25MHz
40MHz
50MHz
Table 21
(page 41)
2.7V
Table 24
(page 45)
Grade 6
Grade 6
2.3V
2.7V
Table 23
(page 43)
2.3V
2.7V
40MHz
75MHz
Table 23
(page 43)
Table 22
Table 24
(page 42)
(page 45)
Table 17: AC Measurement Conditions
Symbol
Parameter
Min
30
Max
30
Unit
pF
ns
V
CL
Load capacitance
Input rise and fall times
Input pulse voltages
–
5
0.2VCC
0.3VCC
VCC / 2
0.8VCC
0.7VCC
VCC / 2
Input timing reference voltages
Output timing reference voltages
V
V
Figure 22: AC Measurement I/O Waveform
Input levels
0.8VCC
Input and output
timing reference levels
0.7VCC
0.5VCC
0.3VCC
0.2VCC
Table 18: Capacitance
Symbol Parameter
Test condition
VOUT = 0 V
Min
Max
Unit
pF
Notes
COUT
CIN
Output capacitance (DQ1)
–
–
8
6
1
Input capacitance (other pins)
VIN = 0 V
pF
1. Values are sampled only, not 100% tested, at TA=25°C and a frequency of 25MHz.
Note:
PDF: 09005aef8456654f
m25p40.pdf - Rev. Y 8/12 EN
Micron Technology, Inc. reserves the right to change products or specifications without notice.
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