26. Electrical Characteristics
All DC/AC characteristics contained in this datasheet are based on simulations and characterization of similar devices in the
same process and design methods. These values are preliminary representing design targets, and will be updated after
characterization of actual automotive silicon data.
26.1 Absolute Maximum Ratings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Parameters
Min.
–40
Typ.
Max.
+125
+150
VCC + 0.5
+13
Unit
°C
°C
V
Operating temperature
Storage temperature
–65
Voltage on any pin except RESET with respect to ground
Voltage on RESET with respect to ground
Maximum operating voltage
DC current per I/O pin
–0.5
–0.5
V
6
V
40
mA
mA
mA
DC current VCC and GND pins
Injection current at VCC = 0V to 5V
200
±5(1)
Note:
1. Maximum current per port = ±30mA
26.2 DC Characteristics
TA = –40°C to +125°C, VCC = 2.7V to 5.5V (unless otherwise noted)
Parameter
Condition
Symbol
Min.
Typ.
Max.
Unit
Port B, C and D and XTAL1,
XTAL2 pins as I/O
(1)
Input low voltage
VIL
–0.5
0.2VCC
V
V
V
V
Port B, C and D and XTAL1,
XTAL2 pins as I/O
(2)
(2)
Input high voltage
Input low voltage
Input high voltage
VIH
VIL1
VIH1
0.6VCC
VCC + 0.5
XTAL1 pin, external clock
Selected
(1)
–0.5
0.1VCC
XTAL1 pin, external clock
selected
0.8VCC
VCC + 0.5
Notes: 1. “Max” means the highest value where the pin is guaranteed to be read as low
2. “Min” means the lowest value where the pin is guaranteed to be read as high
3. Although each I/O port can sink more than the test conditions (10mA at VCC = 5V, 6mA at VCC = 3V) under steady state
conditions (non-transient), the following must be observed:
1] The sum of all IOL, for ports B0 - B1, C2 - C3, D4, E1 - E2 should not exceed 70mA.
2] The sum of all IOL, for ports B6 - B7, C0 - C1, D0 -D3, E0 should not exceed 70mA.
3] The sum of all IOL, for ports B2 - B5, C4 - C7, D5 - D7 should not exceed 70mA.
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current
greater than the listed test condition.
4. Although each I/O port can source more than the test conditions (10mA at VCC = 5V, 8mA at VCC = 3V) under steady
state conditions (non-transient), the following must be observed:
1] The sum of all IOH, for ports B0 - B1, C2 - C3, D4, E1 - E2 should not exceed 100mA.
2] The sum of all IOH, for ports B6 - B7, C0 - C1, D0 -D3, E0 should not exceed 100mA.
3] The sum of all IOH, for ports B2 - B5, C4 - C7, D5 - D7 should not exceed 100mA.
If IOH exceeds the test condition, VOH may exceed the related specification. Pins are not guaranteed to source current
greater than the listed test condition.
5. Minimum VCC for power-down is 2.5V.
6. The analog comparator Propogation Delay equals 1 comparator clock plus 30nS. See Section 20. “Analog Compara-
tor” on page 225 for comparator clock definition.
ATmega16/32/64/M1/C1 [DATASHEET]
273
7647O–AVR–01/15
MICROCHIP [ MICROCHIP ]
