WME128K8-XXX
ABSOLUTE MAXIMUM RATINGS
TRUTH TABLE
Parameter
Operating Temperature
Storage Temperature
Signal Voltage Relative to GND
Voltage on OE# and A9
Symbol
TA
TSTG
VG
Unit
°C
°C
V
CS#
H
OE#
X
WE#
X
Mode
Standby
Read
Data I/O
High Z
-55 to +125
-65 to +150
-0.6 to + 6.25
-0.6 to +13.5
L
L
H
Data Out
L
H
L
Write
Data In
V
X
H
X
Out Disable
Write
High Z/Data Out
NOTE:
X
X
H
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
X
L
X
Inhibit
CAPACITANCE
TA = +25°C
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
CIN
Conditions
Max Unit
Parameter
Symbol
VCC
VIH
Min
4.5
2.0
-0.5
-55
-40
Max
5.5
Unit
V
Input Capacitance
Output Capacitance
VIN = 0 V, f = 1MHz
VI/O = 0 V, f = 1MHz
20
20
pF
pF
Supply Voltage
COUT
Input High Voltage
Input Low Voltage
Operating Temp. (Mil.)
Operating Temp. (Ind.)
VCC + 0.3
+0.8
+125
+85
V
V
°C
°C
This parameter is guaranteed by design but not tested.
VIL
TA
TA
DC CHARACTERISTICS
VCC = 5.0V, VSS = 0V, -55°C ≤ TA ≤ +125°C
Parameter
Symbol
ILI
ILO
ICC
ISB
Conditions
Min
Max
10
10
80
0.625
0.45
Unit
Input Leakage Current
Output Leakage Current
Operating Supply Current
Standby Current
Output Low Voltage
Output High Voltage
VCC = 5.5, VIN = GND to VCC
μA
μA
mA
mA
V
CS# = VIH, OE# = VIH, VOUT = GND to VCC
CS# = VIL, OE# = VIH, f = 5MHz, VCC = 5.5
CS# = VIH, OE# = VIH, f = 5MHz, VCC = 5.5
IOL = 2.1mA, VCC = 4.5V
VOL
VOH
IOH = -400μA, VCC = 4.5V
2.4
V
NOTE: DC test conditions: VIH = VCC -0.3V, VIL = 0.3V
FIGURE 2 – AC TEST CIRCUIT
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
V
IL = 0, VIH = 3.0
V
ns
V
Input Rise and Fall
5
I
OL
Input and Output Reference Level
Output Timing Reference Level
NOTES:
1.5
1.5
Current Source
V
V
I
Z is programmable from -2V to +7V.
OL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75Ω.
Z is typically the midpoint of VOH and VOL
OL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
V
~ 1.5V
~
z
D.U.T
= 50 pf
Bipolar Supply
C
eff
V
I
.
I
OH
Current Source
2
4311.11E-0718-ss-WME128K8-XXX
Mercury Corp. - Memory and Storage Solutions • (602) 437-1520 • www.mrcy.com
MERCURY [ MERCURY UNITED ELECTRONICS INC ]
